0000-0002-2967-5277
Steckhan, Dirk; Paulus, Dietrich
A quadratic programming approach for the mosaicing of virtual slides that incorporates the positioning accuracy of the microscope stageRicardo Armentano; Donna Hudson; Jorge E. Monzon; James L. Patton (Hrsg). Proceedings of the 32nd Annual International Conference of the IEEE Engineering in Medicine and Biology Society EMBC 2010 - “Merging Medical Humanism and Technology”: August 31 - September 4, 2010; Buenos Aires, Argentina. Piscataway, NJ: IEEE Institute of Electrical and Electronics Engineers 2010 S. 72 - 77
Greve, Sönke; Grzegorzek, Marcin; Saathoff, Carsten et al.
Classification of Image Regions Using the Wavelet Standard Deviation DescriptorMaria Ganzha;Marcin Paprzycki (Hrsg). Proceedings of the International Multiconference on Computer Science and Information Technology IMCSIT: October 18–20, 2010. Wisła, Poland; Volume 5. Piscataway, NJ: IEEE Institute of Electrical and Electronics Engineers 2010 S. 703 - 708
Hans, Wolfram; Paulus, Dietrich
Colorimetric Object ClassificationVaclav Skala (Hrsg). Poster Proceedings of the 18 International Conference in Central Europe on Computer Graphics, Visualization and Computer Vision in co-operation with EUROGRAPHICS WSCG 2010: February 1. - 4., 2010; Plzen, Czech Republic. Plzen: Vaclav Skala - Union Agency 2010 S. 23 - 26
Graf, Felix; Grzegorzek, Marcin; Paulus, Dietrich
Counting Lymphocytes in Histopathology Images Using Connected ComponentsDevrim Ünay; Zehra Çataltepe; Selim Aksoy (Hrsg). Recognizing Patterns in Signals, Speech, Images and Videos: ICPR 2010 Contests, Istanbul, Turkey, August 23-26, 2010, Contest Reports. Berlin: Springer 2010 S. 263 - 269
Decker, Peter; Thierfelder, Susanne; Paulus, Dietrich et al.
Dense Statistic Versus Sparse Feature-Based Approach for 3D Object RecognitionYuri Zhuravlev; Igor Gurevich; Vladimir Kutuzov; Heinrich Niemann (Hrsg). 10-ja Meždunarodnaja Konferencija "Identifikacija Častic i Analiz Izobraženij: Novye Informacionnye Technologii": PRIA-10-2010, 5 - 12 dekabrja 2010, Sankt-Peterburg ; materialy konferencii - 10th International Conference "Pattern Recognition and Image Analysis: New Information Technologies": PRIA-10-2010, 5 - 12 Dezember 2010, Sankt-Peterburg. Sankt-Peterburg: Politechnika 2010 S. 181 - 184
Ameling, Stefan; Wirth, Stephan; Shevchenko, Nikita et al.
Detection of Lesions in Colonoscopic Images: A ReviewOlaf Dössel; Wolfgang C. Schlegel (Hrsg). World Congress on Medical Physics and Biomedical Engineering, September 7 - 12, 2009, Munich, Germany: Vol. 25/4 Image Processing, Biosignal Processing, Modelling and Simulation, Biomechanics. Berlin: Springer 2010 S. 995 - 998 (978-3-642-03897-6)
Gossow, David; Decker, Peter; Paulus, Dietrich
Extending SURF to the Color DomainJussi Parkkinen;Timo Jääskeläinen;Theo Gevers;Alain Trémeau (Hrsg). Proceedings of the 5th European Conference on Colour in Graphics, Imaging, and Vision and 12th International Symposium on Multispectral Colour Science CGIV 2010/MCS'10: Joensuu, Finland; June 14-17, 2010. Springfield, VA: Society for Imaging Science and Technology 2010 S. 215 - 221
Engelhardt, Sandy; Ameling, Stefan; Wirth, Stephan et al.
Features for Classification of Polyps in ColonoscopyThomas Martin Deserno;Heinz Handels;Hans-Peter Meinzer;Thomas Tolxdorff (Hrsg). Bildverarbeitung für die Medizin 2010: Algorithmen - Systeme - Anwendungen ; Proceedings des [BVM]-Workshops vom 14. bis 16. März 2010 in Aachen. Berlin: Springer 2010 S. 350 - 354 (Informatik Aktuell)
Hedrich, Jens; Paulus, Dietrich; Mäkeler, Hendrik et al.
Image-Based Comparison of Pre-modern Coins and MedalsKarl-Heinz Franke;Rico Nestler (Hrsg). 16. Workshop Farbbildverarbeitung: 7. - 8. Oktober 2010; Ilmenau. Ilmenau: Zentrum für Bild- und Signalverarbeitung e.V. Ilmenau 2010 S. 156 - 169
Nüchter, Andreas; Elseberg, Jan; Schneider, Peter et al.
Linearization of Rotations for Globally Consistent n-Scan MatchingWesley Snyder; Vijay Kumar (Hrsg). Proceedings of the 2010 IEEE International Conference on Robotics and Automation ICRA 2010: Anchorage, Alaska, USA; 3 - 8 May 2010. Piscataway, NJ: IEEE Institute of Electrical and Electronics Engineers 2010 S. 1373 - 1379