Prof. Dr. rer. nat. Thomas Wilhein
FB Mathematik und Technik, Hochschule Koblenz
- 02642/932-203
- 02642/932-399
Loetgering, Lars; Hammoud, R.; Juschkin, Larissa et al.
A phase retrieval algorithm based on three-dimensionally translated diffraction patternsepl : a letters journal exploring the frontiers of physics. Bd. 111. H. 6. Les Ulis: EDP Science 2015 64002
Baumbach, Stefan; Kanngießer, Birgit; Malzer, Wolfgang et al.
Setup of an 8 keV laboratory transmission x-ray microscopeJournal of physics. Conference series. Bd. 499. H. 1. Bristol: Institute of Physics : IOP 2014 012005
Ewald, Johannes; Wieland, Marek; Nisius, Thomas et al.
Spatial characterization of the focus produced by an EUV Schwarzschild objectiveJournal of Physics : Conference Series. Bd. 499. H. 1. Bristol: Institute of Physics : IOP 2014 12008
Wessels, Philipp; Ewald, Johannes; Wieland, Marek et al.
Time-resolved imaging of domain pattern destruction and recovery via nonequilibrium magnetization statesPhysical review : B ; condensed matter and materials physics. Bd. 90. H. 18. College Park, MD: American Physical Society 2014 184417
Wessels, Philipp; Ewald, Johannes; Wieland, Marek et al.
Time-resolved soft X-ray microscopy of magnetic nanostructures at the P04 beamline at PETRA IIIJournal of Physics : Conference Series. Bd. 499. H. 1. Bristol: Institute of Physics : IOP 2014 012009
Abbati, Gennaro; Seim, Christian; Legall, Herbert et al.
Preparation of clay mineral samples for high resolution X-ray imagingJournal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012051
Baumbach, Stefan; Wilhein, Thomas
The use of zoneplates for point projection imagingJournal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012014
Wessels, Philipp; Schlie, Moritz; Wieland, Marek et al.
XMCD microscopy with synchronized soft X-ray and laser pulses at PETRA III for time-resolved studiesJournal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012023
Overbuschmann, Johannes; Hengster, Julia; Irsen, Stephan et al.
Fabrication of Fresnel zone plates by ion-beam lithography and application as objective lenses in extreme ultraviolet microscopy at 13 nm wavelengthOptics Letters. Bd. 37. H. 24. Washington, DC: Soc. 2012 S. 5100 - 5102
Lebert, Rainer; Farahzadi, Azadeh; Diete, Wolfgang et al.
Actinic EUV-mask metrology : tools, concepts, componentsBehringer, Uwe F.W. (Hrsg). Proceedings of SPIE : 27th European Mask and Lithography Conference. Bd. 7985. Dresden: SPIE 2011 79850B
Heine, Ruth; Gorniak, Thomas; Nisius, Thomas et al.
Digital in-line X-ray holography with zone platesUltramicroscopy. Bd. 111. H. 8. Amsterdam: Elsevier Science 2011 S. 1131 - 1136
Rosmej, O. N.; Bagnoud, Vincent; Eisenbarth, Udo et al.
Heating of low-density CHO-foam layers by means of soft x-raysNuclear instruments and methods in physics research : Section A ; accelerators, spectrometers, detectors and associated equipment. Bd. 653. H. 1. Amsterdam: North-Holland Publ. Co. 2011 S. 52 - 57
Lenz, Johannes; Krupp, Nikolai; Wilhein, Thomas et al.
Nanofabrication of Optical Elements for SXR and EUV Applications : Ion Beam Lithography as a New ApproachMcNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 104 - 107
Benk, Markus P.; Bergmann, Klaus; Querejeta-Fernández, A et al.
Soft X‐Ray Microscopic Investigation on Self Assembling NanocrystalsMcNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 433 - 436
Ewald, Johannes; Wilhein, Thomas
Source Size Characterization of a Microfocus X‐ray Tube Used for In‐Line Phase‐Contrast ImagingMcNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 81 - 83
Orlov, N. Y.; Denisov, O. B.; Rosmej, O. N. et al.
Theoretical and experimental studies of material radiative properties and their applications to laser and heavy ion inertial fusionLaser and particle beams : pulse power and high energy densities. Bd. 29. H. 1. Cambridge: Cambridge Univ. Press 2011 S. 69 - 80
Mancuso, Adrian; Gorniak, Thomas; Staier, Florian et al.
Coherent imaging of biological samples with femtosecond pulses at the free-electron laser FLASHNew journal of physics : the open-access journal for physics. Bd. 12. H. 3. Bad Honnef: Dt. Physikalische Ges. 2010 035003
Gutt, Christian; Streit-Nierobisch, Simone; Stadler, Lorenz-M. et al.
Single-pulse resonant magnetic scattering using a soft x-ray free-electron laserPhysical review : B ; condensed matter and materials physics. Bd. 81. H. 10. College Park, Md.: American Physical Society 2010 100401
Nisius, Thomas; Früke, Rolf; Schäfer, David et al.
Advances in X-ray microscopy at FLASH using transmissive opticsJournal of Physics : Conference Series. Bd. 186. H. 1. Bristol: IOP Publ. 2009 012057
Nisius, Thomas; Schäfer, David; Früke, Rolf et al.
Applicability of transmissive diffractive optics to high flux FEL radiationProceedings of SPIE : Damage to VUV, EUV, and X-Ray Optics II. Bd. 2009. H. 7361. Bellingham, Wash.: SPIE : International Society for Optical Engineering 2009 73610Y
Mancuso, Adrian; Schropp, Andreas; Reime, Bernd et al.
Coherent-Pulse 2D Crystallography Using a Free-Electron Laser X-Ray SourcePRL : Physical Review Letters. Bd. 102. H. 3. College Park, MD: APS 2009 035502
Schäfer, David; Wiesemann, Urs; Nisius, Thomas et al.
Degradation of thin-film filters irradiated by debris emission of a laser induced plasmaProceedings of SPIE : Damage to VUV, EUV and X-ray Optics II. Bd. 7361. Bellingham, Wash.: SPIE 2009 73610V
Rosenhahn, Axel; Staier, Florian; Nisius, Thomas et al.
Digital In-line Holography with femtosecond VUV radiation provided by the free-electron laser FLASHOptics express : the international electronic journal of optics. Bd. 17. H. 10. Washington, DC: Soc. 2009 S. 8220 - 8228
Benk, Markus; Schäfer, David; Wilhein, Thomas et al.
High power soft x-ray source based on a discharge plasmaJournal of Physics : Conference Series. Bd. 186. H. 1. Bristol: IOP Publ. 2009 012024
Lenz, Johannes; Wilhein, Thomas; Irsen, Stephan
Nanofabrication of diffractive elements for soft x-ray and extreme ultraviolet applications using ion beam lithographyApplied Physics Letters. Bd. 95. H. 19. Melville, N.Y.: AIP 2009 191118