Prof. Dr. rer. nat. Thomas Wilhein - Publikationen

Loetgering, Lars; Du, Mengqi; Boonzajer Flaes, Dirk et al.
PtyLab.m/py/jl : a cross-platform, open-source inverse modeling toolbox for conventional and Fourier ptychography
Optics Express. Bd. 31. H. 9. Optica Publishing Group 2023 S. 13763

Eusterhues, Karin; Thieme, Juergen; Haidl, Andreas et al.
Imaging distribution and speciation of P across natural Fe oxides, clay minerals, microorganisms, and diatoms by Nano-XRF and Nano-NEXAFS
Goldschmidt2022 abstracts. Lyon: European Association of Geochemistry 2022

Wilhein, Thomas; Loetgering, Lars; Aidukas, Tomas et al.
ptyLab : a cross-platform inverse modeling toolbox for conventional and Fourier ptychography
Computational Optical Sensing and Imaging 2021 : Washington, DC United States
19–23 July 2021. Washington, DC: Optical Society of America 2021 paper CW6B.3

Thieme, Jürgen; Eusterhues, Karin; Luehl, Lars et al.
XRF and P K-edge XANES on natural mineral-organic associations
Goldschmidt 2021, Virtual, 4-9 July. o.A.: European Association of Geochemistry 2021

Loetgering, Lars; Baluktsian, Margarita; Keskinbora, Kahraman et al.
Generation and characterization of focused helical x-ray beams
Science Advances. Bd. 6. H. 7. American Association for the Advancement of Science (AAAS) 2020 S. 1 - 6 eaax8836

Thieme, Juergen; Eusterhues, Karin; Luehl, Lars et al.
Natural Mineral-Organic Associations Studied by XRF and P-Edge XANES
Goldschmidt 2020, Virtual, 21-26 June. o.A.: Geochemical Society 2020

Lühl, Lars; Andrianov, Konstantin; Dierks, Hanna et al.
Scanning transmission X-ray microscopy with efficient X-ray fluorescence detection (STXM-XRF) for biomedical applications in the soft and tender energy range
Journal of Synchrotron Radiation. Bd. 26. H. 2. Oxford: Blackwell Publ. 2019 ePub

von Wezyk, Alexander; Andrianov, Konstantin; Wilhein, Thomas et al.
Target materials for efficient plasma-based extreme ultraviolet sources in the range of 6 to 8 nm
Journal of Physics D : Applied Physics. Bd. 52. H. 50. Bristol: IOP Publ. 2019 S. 505202

Nisius, T.; Andrianov, K.; Haidl, A. et al.
A flexible x-ray imaging endstation for synchrotron radiation facilities
Journal of Instrumentation. Bd. 13. H. 7. London: IOP Publishing 2018 C07004

Haidl, Andreas; Wiesemann, Urs; Andrianov, Konstantin et al.
A Portable Endstation for Analytical X-ray Microscopy Using Soft X-ray Synchrotron Radiation
Microscopy and Microanalysis : the official journal of the Microscopy Society of America. Bd. 24. H. 2. New York, NY: Cambridge University Press 2018 S. 232 - 233

Loetgering, L.; Treffer, D.; Wilhein, T.
Compression and information recovery in ptychography
Journal of Instrumentation. Bd. 13. H. 4. London: IOP Publishing 2018 C04019

Lötgering, Lars; Rose, Max; Keskinbora, Kahraman et al.
Correction of axial position uncertainty and systematic detector errors in ptychographic diffraction imaging
Optical Engineering. Bd. 57. H. 8. Bellingham, Wash.: SPIE 2018 084106

Hönicke, Philipp; Krämer, Markus; Lühl, Lars et al.
Development and characterization of sub-monolayer coatings as novel calibration samples for X-ray spectroscopy
Spectrochimica Acta Part B : Atomic Spectroscopy. Bd. 145. Amsterdam: Elsevier 2018 S. 36 - 42

Haidl, A.; Andrianov, K.; Nisius, T. et al.
Fast X-ray detection using a CCD for application in a scanning transmission X-ray microscope
Journal of Instrumentation. Bd. 13. H. 6. London: IOP Publishing 2018 C06005

Luhl, L.; Andrianov, K.; Haidl, A. et al.
Scanning Transmission X-Ray Microscopy in the Soft Energy Range with Very Large Solid Angle of Detection for X-ray Fluorescence Imaging
Microscopy and Microanalysis : the official journal of the Microscopy Society of America. Bd. 24. H. 2. New York, NY: Cambridge University Press 2018 S. 86 - 87

Andrianov, K.; Haidl, A.; Lühl, L. et al.
Scanning X-ray microscopy with large solid angle X-ray fluorescence detection at the XUV beamline P04, DESY
Journal of Instrumentation. Bd. 13. H. 5. London: IOP Publishing 2018 C05013

Loetgering, Lars; Rose, Max; Treffer, David et al.
Data compression strategies for ptychographic diffraction imaging
Advanced Optical Technologies. Bd. 6. H. 6. Berlin: De Gruyter 2017 S. 475 - 483

Lötgering, Lars; Fröse, Heinrich; Wilhein, Thomas
Double-blind digital in-line holography from multiple near-field intensities
Hrabovský, Miroslav; Sheridan, John T.; Fimia, Antonio (Hrsg). Proceedings of SPIE, the International Society for Optical Engineering, vol. 10233 : Holography ; Advances and Modern Trends V. Bellingham: SPIE 2017 1023307, 8 Seiten

Fröse, Heinrich; Lötgering, Lars; Wilhein, Thomas
Information recovery in propagation-based imaging with decoherence effects
Hrabovský, Miroslav; Sheridan, John T.; Fimia, Antonio (Hrsg). Proceedings of SPIE, the International Society for Optical Engineering, vol. 10233 : Holography ; Advances and Modern Trends V. Bellingham: SPIE 2017 102331A, 9 Seiten

Loetgering, Lars; Golembusch, M.; Hammoud, R. et al.
Near-Field Diffraction Imaging from Multiple Detection Planes
Journal of Physics : Conference Series. Bd. 849. Bristol: IOP Publishing 2017 012025, 4 Seiten

Loetgering, L.; Froese, H.; Wilhein, T. et al.
Phase retrieval via propagation-based interferometry
Physical Review : A ; Atomic, molecular, and optical physics. Bd. 95. H. 3. Melville, NY: AIP 2017 033819

Andrianov, Konstantin; Lühl, L.; Nisius, T. et al.
Scanning Transmission X-ray Microscopy with X-ray Fluorescence Detection at the XUV Beamline P04, PETRA III, DESY
Journal of Physics : Conference Series. Bd. 849. Bristol: IOP Publishing 2017 012007, 4 Seiten

Ewald, Johannes; Wessels, P.; Wieland, M. et al.
A full-field transmission x-ray microscope for time-resolved imaging of magnetic nanostructures
AIP Conference Proceedings. Bd. 1696. H. 1. Melville, NY: American Institute of Physics 2016 020005

Andrianov, Konstantin; Ewald, Johannes; Nisius, Thomas et al.
Development of a scanning transmission x-ray microscope for the beamline P04 at PETRA III DESY
AIP Conference Proceedings. Bd. 1696. H. 1. Melville, NY: American Institute of Physics 2016 020041

Baumbach, Stefan; Kanngießer, Birgit; Malzer, Wolfgang et al.
A laboratory 8 keV transmission full-field x-ray microscope with a polycapillary as condenser for bright and dark field imaging
Review of scientific instruments. Bd. 86. H. 8. Melville, NY: American Institute of Physics 2015 083708

Loetgering, Lars; Hammoud, R.; Juschkin, Larissa et al.
A phase retrieval algorithm based on three-dimensionally translated diffraction patterns
epl : a letters journal exploring the frontiers of physics. Bd. 111. H. 6. Les Ulis: EDP Science 2015 64002

Baumbach, Stefan; Kanngießer, Birgit; Malzer, Wolfgang et al.
Setup of an 8 keV laboratory transmission x-ray microscope
Journal of physics. Conference series. Bd. 499. H. 1. Bristol: Institute of Physics : IOP 2014 012005

Ewald, Johannes; Wieland, Marek; Nisius, Thomas et al.
Spatial characterization of the focus produced by an EUV Schwarzschild objective
Journal of Physics : Conference Series. Bd. 499. H. 1. Bristol: Institute of Physics : IOP 2014 12008

Wessels, Philipp; Ewald, Johannes; Wieland, Marek et al.
Time-resolved imaging of domain pattern destruction and recovery via nonequilibrium magnetization states
Physical review : B ; condensed matter and materials physics. Bd. 90. H. 18. College Park, MD: American Physical Society 2014 184417

Wessels, Philipp; Ewald, Johannes; Wieland, Marek et al.
Time-resolved soft X-ray microscopy of magnetic nanostructures at the P04 beamline at PETRA III
Journal of Physics : Conference Series. Bd. 499. H. 1. Bristol: Institute of Physics : IOP 2014 012009

Abbati, Gennaro; Seim, Christian; Legall, Herbert et al.
Preparation of clay mineral samples for high resolution X-ray imaging
Journal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012051

Baumbach, Stefan; Wilhein, Thomas
The use of zoneplates for point projection imaging
Journal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012014

Wessels, Philipp; Schlie, Moritz; Wieland, Marek et al.
XMCD microscopy with synchronized soft X-ray and laser pulses at PETRA III for time-resolved studies
Journal of Physics : Conference Series. Bd. 463. H. 1. Bristol: Institute of Physics : IOP 2013 012023

Overbuschmann, Johannes; Hengster, Julia; Irsen, Stephan et al.
Fabrication of Fresnel zone plates by ion-beam lithography and application as objective lenses in extreme ultraviolet microscopy at 13 nm wavelength
Optics Letters. Bd. 37. H. 24. Washington, DC: Soc. 2012 S. 5100 - 5102

Lebert, Rainer; Farahzadi, Azadeh; Diete, Wolfgang et al.
Actinic EUV-mask metrology : tools, concepts, components
Behringer, Uwe F.W. (Hrsg). Proceedings of SPIE : 27th European Mask and Lithography Conference. Bd. 7985. Dresden: SPIE 2011 79850B

Heine, Ruth; Gorniak, Thomas; Nisius, Thomas et al.
Digital in-line X-ray holography with zone plates
Ultramicroscopy. Bd. 111. H. 8. Amsterdam: Elsevier Science 2011 S. 1131 - 1136

Rosmej, O. N.; Bagnoud, Vincent; Eisenbarth, Udo et al.
Heating of low-density CHO-foam layers by means of soft x-rays
Nuclear instruments and methods in physics research : Section A ; accelerators, spectrometers, detectors and associated equipment. Bd. 653. H. 1. Amsterdam: North-Holland Publ. Co. 2011 S. 52 - 57

Lenz, Johannes; Krupp, Nikolai; Wilhein, Thomas et al.
Nanofabrication of Optical Elements for SXR and EUV Applications : Ion Beam Lithography as a New Approach
McNulty, Ian ;  Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 104 - 107

Benk, Markus P.; Bergmann, Klaus; Querejeta-Fernández, A et al.
Soft X‐Ray Microscopic Investigation on Self Assembling Nanocrystals
McNulty, Ian ;  Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 433 - 436

Ewald, Johannes; Wilhein, Thomas
Source Size Characterization of a Microfocus X‐ray Tube Used for In‐Line Phase‐Contrast Imaging
McNulty, Ian ;  Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 81 - 83

Orlov, N. Y.; Denisov, O. B.; Rosmej, O. N. et al.
Theoretical and experimental studies of material radiative properties and their applications to laser and heavy ion inertial fusion
Laser and particle beams : pulse power and high energy densities. Bd. 29. H. 1. Cambridge: Cambridge Univ. Press 2011 S. 69 - 80

Mancuso, Adrian; Gorniak, Thomas; Staier, Florian et al.
Coherent imaging of biological samples with femtosecond pulses at the free-electron laser FLASH
New journal of physics : the open-access journal for physics. Bd. 12. H. 3. Bad Honnef: Dt. Physikalische Ges. 2010 035003

Gutt, Christian; Streit-Nierobisch, Simone; Stadler, Lorenz-M. et al.
Single-pulse resonant magnetic scattering using a soft x-ray free-electron laser
Physical review : B ; condensed matter and materials physics. Bd. 81. H. 10. College Park, Md.: American Physical Society 2010 100401

Nisius, Thomas; Früke, Rolf; Schäfer, David et al.
Advances in X-ray microscopy at FLASH using transmissive optics
Journal of Physics : Conference Series. Bd. 186. H. 1. Bristol: IOP Publ. 2009 012057

Nisius, Thomas; Schäfer, David; Früke, Rolf et al.
Applicability of transmissive diffractive optics to high flux FEL radiation
Proceedings of SPIE : Damage to VUV, EUV, and X-Ray Optics II. Bd. 2009. H. 7361. Bellingham, Wash.: SPIE : International Society for Optical Engineering 2009 73610Y

Mancuso, Adrian; Schropp, Andreas; Reime, Bernd et al.
Coherent-Pulse 2D Crystallography Using a Free-Electron Laser X-Ray Source
PRL : Physical Review Letters. Bd. 102. H. 3. College Park, MD: APS 2009 035502

Schäfer, David; Wiesemann, Urs; Nisius, Thomas et al.
Degradation of thin-film filters irradiated by debris emission of a laser induced plasma
Proceedings of SPIE : Damage to VUV, EUV and X-ray Optics II. Bd. 7361. Bellingham, Wash.: SPIE 2009 73610V

Rosenhahn, Axel; Staier, Florian; Nisius, Thomas et al.
Digital In-line Holography with femtosecond VUV radiation provided by the free-electron laser FLASH
Optics express : the international electronic journal of optics. Bd. 17. H. 10. Washington, DC: Soc. 2009 S. 8220 - 8228

Benk, Markus; Schäfer, David; Wilhein, Thomas et al.
High power soft x-ray source based on a discharge plasma
Journal of Physics : Conference Series. Bd. 186. H. 1. Bristol: IOP Publ. 2009 012024

Lenz, Johannes; Wilhein, Thomas; Irsen, Stephan
Nanofabrication of diffractive elements for soft x-ray and extreme ultraviolet applications using ion beam lithography
Applied Physics Letters. Bd. 95. H. 19. Melville, N.Y.: AIP 2009 191118

Schäfer, David; Benk, Markus; Bergmann, Klaus et al.
Optical setup for tabletop soft X-ray microscopy using electrical discharge sources
Journal of Physics : Conference Series. Bd. 186. H. 1. Bristol: IOP Publ. 2009 012033

Gutt, Christian; Stadler, Lorenz-M.; Streit-Nierobisch, Simone et al.
Resonant magnetic scattering with soft x-ray pulses from a free-electron laser operating at 1.59 nm
Physical review : B ; condensed matter and materials physics. Bd. 79. H. 21. College Park, MD: APS 2009 212406

Bertilson, Michael C.; von Hofsten, Olov; Lindblom, Magnus et al.
Compact high-resolution differential interference contrast soft x-ray microscopy
Applied Physics Letters. Bd. 92. H. 6. Melville, N.Y.: AIP Publishing 2008 064104

Benk, Markus; Bergmann, Klaus; Schäfer, David et al.
Compact soft x-ray microscope using a gas discharge light source
Optics Letters. Bd. 33. H. 20. Washington, DC. 2008 S. 2359 - 2361

Schäfer, David; Nisius, Thomas; Früke, Rolf et al.
Compact x-ray microscopes for EUV- and soft x-radiation with spectral imaging capabilities
Advances in X-Ray/EUV Optics, Components and Applications. Bd. 6317. Bellingham, Wash.: SPIE 2007 631704

Lindblom, Magnus; Tuohimaa, Tomi; Holmberg, Anders et al.
High-resolution differential interference contrast X-ray zone plates : design and fabrication
Spectrochimica Acta, Part B : Atomic Spectroscopy. Bd. 62. H. 6-7. Amsterdam: Elsevier 2007 S. 539 - 543

Nisius, Thomas; Schäfer, David; Früke, Rolf et al.
Wavefront analysis and beam profiling from 40 eV up to 40 keV
Advances in X-Ray/EUV Optics, Components and Applications. Bd. 6317. Bellingham, Wash.: SPIE 2007 6317E

Vogt, Ulrich; Lindblom, Magnus; Charalambous, Pambos et al.
Condenser for Koehler-like illumination in transmission x-ray microscopes at undulator sources
Optics Letters. Bd. 31. H. 10. Washington, DC: Soc. 2006 S. 1465 - 1467

Vogt, Ulrich; Wilhein, Thomas; Legall, Herbert et al.
High-Resolution X-Ray Absorption Spectroscopy Using a Laser Plasma Radiation Source
Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 334 - 336

Vogt, Ulrich; Lindblom, Magnus; Jansson, Per A. C. et al.
Towards Soft X-Ray Phase-Sensitive Imaging with Diffractive Optical Elements
Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 91 - 93

Wieland, Marek; Wilhein, Thomas; Spielmann, Christian et al.
Towards Table-Top Time-Resolved Soft X-Ray Microscopy Imaging With a Laboratory High-Harmonic Source at 100 eV
Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 369 - 371

Kaulich, Burkhard; Bacescu, Daniel; Susini, Jean et al.
TwinMic : a European Twin X-ray Microscopy Station Comissioned at ELETTRA
Aoki, Sadao (Hrsg). Proceedings of the 8th International Conference on X-ray microscopy. Tokio: IPAP : Institute of Pure and Applied Physics 2006 S. 22 - 25

Früke, Rolf; Kutzner, Jörg; Witting, Tobias et al.
EUV scanning transmission microscope operating with high-harmonic and laser plasma radiation
epl : a letters journal exploring the frontiers of physics. Bd. 72. H. 6. Les Ulis: EDP Sciences 2005 S. 915 - 921

Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
Phase and intensity control through diffractive optical elements in X-ray microscopy
Journal of Electron Spectroscopy and Related Phenomena : the international journal on theoretical, experimental and applied aspects of electron spectroscopy. Bd. 144-147. New York [u.a.]: Elsevier 2005 S. 957 - 961

Vogt, Ulrich; Lindblom, Magnus; Jansson, Per A. C. et al.
Single optical element soft x-ray interferometer using a laser plasma x-ray source
Optics Letters. Bd. 30. H. 16. Washington, DC: Soc. 2005 S. 2167 - 2169

Wieland, Marek; Spielmann, Christian; Westerwalbesloh, Thomas et al.
Toward time-resolved soft x-ray microscopy using pulsed fs-high-harmonic radiation
Ultramicroscopy. Bd. 102. H. 2. Amsterdam: Elsevier Science 2005 S. 93 - 100

Wieland, Marek; Wilhein, Thomas; Kleineberg, Ulf et al.
Applications of high-harmonic radiation for interferometry and spectroscopy
Krausz, Ferenc (Hrsg). Ultrafast Optics IV. Berlin [u.a.]: Springer 2004 S. 467 - 474

Vogt, Ulrich; Wilhein, Thomas; Legall, Herbert et al.
High resolution x-ray absorption spectroscopy using a laser plasma radiation source
Review of Scientific Instruments. Bd. 75. H. 11. Melville, NY: AIP 2004 S. 4606 - 4609

Vogt, Ulrich; Frueke, Rolf; Wilhein, Thomas et al.
High-resolution spatial characterization of laser produced plasmas at soft x-ray wavelengths
Applied Physics : B ; Lasers and optics. Bd. 78. H. 1. Berlin [u.a.]: Springer 2004 S. 53 - 58

Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
Design and Fabrication of new optics for X-ray microscopy and material sciences
Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 177 - 183

Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
Differential Interference Contrast X-ray Microscopy at ESRF Beamline ID 21
Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 535 - 541

Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
Diffractive optical elements for differential interference contrast x-ray microscopy
Optics Express. Bd. 11. H. 19. Washington, DC: Soc. 2003 S. 2278 - 2288

Wieland, Marek; Früke, Rolf; Wilhein, Thomas et al.
Hohe Harmonische im EUV : Charakterisierung und erste Anwendungen
Buzug, Thorsten M. (Hrsg). Physikalische Methoden der Laser- und Medizintechnik. Düsseldorf: VDI-Verl. 2003 S. 260 - 266

Früke, Rolf; Wilhein, Thomas; Wieland, Marek et al.
Imaging of a laser plasma source at 13 nm wavelength approaching submicrometer resolution
Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 153 - 156

Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
Nano-optical elements fabricated by e-beam and x-ray lithography
Proceedings of SPIE : Nano- and Micro-Optics for Information Systems. Bd. 5225. Bellingham, Wash.: SPIE 2003 S. 113 - 125

Buzug, Thorsten M.; Hartmann, Ulrich; Hülster, Anke et al.
Physikalische Methoden der Laser- und Medizintechnik
Düsseldorf: VDI-Verl. 2003 310 S. (Reihe 17 : Biotechnik, Medizintechnik ; 231)

Di Fabrizio, Enzo; Cabrini, Stefano; Cojoc, Dan et al.
Shaping X-rays by diffractive coded nano-optics
Microelectronic Engineering : an international journal of semiconductor manufacturing technology. Bd. 67-68. H. 1. Amsterdam: Elsevier 2003 S. 87 - 95

Wieland, Marek; Früke, Rolf; Wilhein, Thomas et al.
Sub-micron imaging in the EUV-spectral range using high-harmonic radiation
Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 149 - 152

Kaulich, Burkhard; Susini, Jean; David, Christian et al.
Twinmic : a European twin microscope station combining full-field imaging and scanning microscopy
Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 103 - 107

Kaulich, Burkhard; Susini, Jean; David, Christian et al.
TwinMic : combined Scanning and Full-field Imaging Microscopy with Novel Contrast Mechanisms
SRN : Synchrotron Radiation News. Bd. 16. H. 3 : Special Issue " X‐ray Microscopy". Philadelphia, Pa.: Taylor & Francis 2003 S. 49 - 52

Wieland, Marek; Wilhein, Thomas; Spielmann, Christian et al.
Zone plate interferometry at 13 nm wavelength
Applied Physics : B ; Lasers and optics. Bd. 76. H. 8. Berlin [u.a.]: Springer 2003 S. 885 - 889

Wilhein, Thomas
A new powerful source for coherent VUV radiation : Demonstration of exponential growth and saturation at the TTF free-electron laser
The European physical Journal : D ; Atoms, molecules and clusters. Bd. 20. H. 1. Berlin [u.a.]: Springer 2002 S. 149 - 156

Di Fabrizio, Enzo; Kaulich, Burkhard; Wilhein, Thomas et al.
Differential Interference Contrast for X-Ray Microscopy : Fabrication and Characterization of Twin Zone Plate Optics
Surface Review and Letters : SRL. Bd. 9. H. 1. Singapore: World Scientific Publ. 2002 S. 243 - 248

Kaulich, Burkhard; Wilhein, Thomas; Di Fabrizio, Enzo et al.
Differential interference contrast x-ray microscopy with twin zone plates
Journal of the Optical Society of America : JOSA ; A : Optics, image science and vision. Bd. 19. H. 4. Washington, DC: Soc. 2002 S. 797 - 806

Kaulich, Burkhard; Polack, Francois; Neuhaeuser, Ulrich et al.
Diffracting aperture based differential phase contrast for scanning X-ray microscopy
Optics express : the international electronic journal of optics. Bd. 10. H. 20. Washington, DC: Soc. 2002 S. 1111 - 1117

Di Fabrizio, Enzo; Cabrini, Stefano; Cojoc, Dan et al.
Novel diffractive optics for x-ray beam shaping
Proceedings of SPIE : Design and Microfabrication of Novel X-Ray Optics. Bd. 4783. Bellingham, Wash.: SPIE 2002 S. 105 - 114

Wieland, Marek; Wilhein, Thomas; Frueke, Rolf et al.
Submicron Extreme Ultraviolet Imaging Using High-Harmonic Radiation
Applied Physics Letters. Bd. 81. H. 14. Melville, NY: American Institute of Physics 2002 S. 2520 - 2522

Beck, Michael; Vogt, Ulrich; Will, Ingo et al.
A pulse-train laser driven XUV source for picosecond pump-probe experiments in the water window
Optics Communications. Bd. 190. H. 1-6. Amsterdam [u.a.]: Elsevier 2001 S. 317 - 326

Vogt, Ulrich; Wieland, Marek; Wilhein, Thomas et al.
Design and application of a zone plate monochromator for laboratory soft x-ray sources
Review of Scientific Instruments : RSI. Bd. 72. H. 1. Melville, NY: AIP 2001 S. 53 - 57

Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
Differential interference contrast x-ray microscopy
Proceedings of SPIE : Soft X-Ray and EUV Imaging Systems II. Bd. 4506. Bellingham, Wash.: SPIE 2001 S. 163 - 171

Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
Differential interference contrast x-ray microscopy with submicron resolution
Applied Physics Letters. Bd. 78. H. 14. Melville, NY: AIP 2001 S. 2082 - 2084

Wieland, Marek; Wilhein, Thomas; Faubel, Manfred et al.
EUV and fast ion emission from cryogenic liquid jet target laser-generated plasma
Applied Physics : B ; Lasers and optics. Bd. 72. H. 5. Berlin [u.a.]: Springer 2001 S. 591 - 597

Vogt, Ulrich; Stiel, Holger; Will, Ingo et al.
Influence of laser intensity and pulse duration on the EUV-yield from a water jet target laser plasma
Appl. Phys. Lett. Bd. 79. H. 15. Melville, NY: AIP 2001 S. 2336 - 2338

Vogt, Ulrich; Stiel, Holger; Will, Ingo et al.
Liquid water jet laser plasma source for extreme ultraviolet lithography
Deutsche Physikalische Gesellschaft (Hrsg). Verhandlungen der Deutschen Physikalischen Gesellschaft. Bd. 2001. Berlin. 2001 36

Vogt, Ulrich; Stiel, Holger; Will, Ingo et al.
Scaling-up a liquid water jet laser plasma source to high average power for Extreme Ultraviolet Lithography
Proceedings of SPIE : Emerging Lithographic Technologies V. Bd. 4343. Bellingham, Wash.: SPIE 2001 S. 535 - 542

Wieland, Marek; Faubel, Manfred; Schmidt, Martin et al.
Soft X-ray and EUV emission from cryogenic liquid jets irradiated with fs, ps, and ns-laser pulses
Proceedings of SPIE : Application of X-Rays Generated from Lasers and Other Bright Sources II. Bd. SPIE 4504. Bellingham, Wash.: SPIE 2001 S. 62 - 68

Wilhein, Thomas; Kaulich, Burkhard; Susini, Jean
Two zone plate interference contrast microscopy at 4 keV photon energy
Optics Communications. Bd. 193. H. 1. Amsterdam [u.a.]: Elsevier 2001 S. 19 - 26

Berglund, Magnus; Rymell, Lars; Peuker, Markus et al.
Compact water-window transmission X-ray microscopy
Journal of Microscopy. Bd. 197. H. 3. Oxford [u.a.]: Wiley-Blackwell 2000 S. 268 - 273

Hertz, Hans M.; Berglund, Magnus; Johansson, Goeran A. et al.
Compact water-window x-ray microscopy with a laser plasma droplet source
Meyer-Ilse, Werner (Hrsg). X-ray Microscopy : Proceedings of the VI International Conference. Melville, NY: AIP 2000 S. 721 - 725 Vol. 507

Wieland, Marek; Vogt, Ulrich; Faubel, Manfred et al.
Development and Characterization of a Soft X-ray Source using Room Temperature and Cryogenic Liquid Jets as low Debris Target
Meyer-Ilse, Werner (Hrsg). AIP Conf. Proc. Melville, NY: AIP 2000 S. 726 - 730 Vol. 507

Sorge, S.; Wierling, August; Röpke, Gerd et al.
Diagnostics of a laser-induced dense plasma by hydrogen-like carbon spectra
Journal of Physics B : atomic, molecular and optical Physics. Bd. 33. H. 16. Bristol: IOP Publ. 2000 S. 2983 - 3000

Schnürer, Matthias; Cheng, Z.; Hentschel, Mario et al.
Few-cycle-driven XUV laser harmonics : generation and focusing
Applied Physics : B ; Lasers and optics. Bd. 70. H. Supplement S1. Berlin [u.a.]: Springer 2000 S. 227 - 232

Hertz, Hans M.; Rymell, Lars; Berglund, Magnus et al.
A normal-incidence condenser mirror arrangement for compact water-window x-ray microscopy
Hoover, Richard B. ; Walker, Arthur B.C. (Hrsg). Proceedings of SPIE : X-ray optics, instruments and missions II. Bellingham, Wash.: SPIE : International Society for Optical Engineering 1999 247

Wilhein, Thomas; Rehbein, Stefan; Hambach, D. et al.
A slit grating spectrograph for quantitative soft x-ray spectroscopy
Review of Scientific Instruments. Bd. 70. H. 3. Melville, NY: American Institute of Physics 1999 1694

Fiedorowicz, Henryk; Daido, Hiroyuki; Bartnik, Andrzej et al.
Emission from a gas puff target irradiated with a Nd:YAG laser for EUV and x-ray lithography
Vladimirsky, Yuli (Hrsg). Proceedings of SPIE : Emerging Lithographic Technologies III. Bellingham, Wash.: SPIE : International Society for Optical Engineering 1999 400

Kaulich, Burkhard; Oestreich, Sebastian; Salome, M. et al.
Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nm
Applied Physics Letters. Bd. 75. H. 26. Melville, NY: American Institute of Physics 1999 4061

Teubner, Ulrich; Wagner, U.; Oberschmidt, David et al.
High Brightness X-Radiation and Plasma Frequency Emission from Femtosecond Laser Plasmas
Optical Society of America : OSA (Hrsg). Applications of High Field and Short Wavelength Sources VIII. Washington, DC. 1999 WA3

Fiedorowicz, Henryk; Bartnik, Andrzej; Szczurek, Mirosław et al.
Investigation of soft X-ray emission from a gas puff target irradiated with a Nd: YAG laser
Optics Communications. Bd. 163. H. 1-3. Amsterdam: Elsevier 1999 S. 103 - 114

Doron, R.; Behar, E.; Mandelbaum, P. et al.
Spectroscopic signature of strong dielectronic recombination in highly ionized xenon produced by irradiating a gas puff with laser
Physical review : A ; atomic, molecular and optical physics. Bd. 59. H. 1. College Park, MD: American Physical Society 1999 S. 188 - 194

Berglund, Magnus; Rymell, Lars; Hertz, Hans M. et al.
Cryogenic liquid-jet target for debris-free laser-plasma soft x-ray generation
Review of Scientific Instruments : RSI. Bd. 69. H. 6. Melville, NY: American Institute of Physics 1998 S. 2361 - 2364

Wilhein, Thomas
Investigations on Laser-Generated Plasma Sources
Thieme, Jürgen (Hrsg). X-Ray Microscopy and Spectromicroscopy : Part V. Berlin [u.a.]: Springer 1998 S. 373 - 383

Lebert, R; Schriever, G; Wilhein, Thomas et al.
Soft x-ray emission of laser-produced plasmas using a low-debris cryogenic nitrogen target
Journal of Applied Physics. Bd. 84. H. 6. Melville, NY: American Institute of Physics 1998 S. 3419 - 3421

Wilhein, Thomas; Altenbernd, D.; Teubner, U. et al.
X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plate
Journal of the Optical Society of America : JOSA ; B : Optical physics. Bd. 15. H. 3. Washington, DC: Optical Society of America 1998 S. 1235 - 1241

Fiedorowicz, Henryk; Bartnik, Andrzej; Jarocki, Roman et al.
X-ray emission in the ‘water window’ from a nitrogen gas puff target irradiated with a nanosecond Nd:glass laser pulse
Applied Physics : B ; Lasers and optics. Bd. 67. H. 3. New York [u.a.]: Springer 1998 S. 391 - 393

Wilhein, Thomas; Hambach, D.; Niemann, Bastian et al.
Off-axis reflection zone plate for quantitative soft x-ray source characterization
Applied Physics Letters. Bd. 71. H. 2. Woodbury, NY: American Institute of Physics 1997 S. 190 - 192

Niemann, Bastian; Wilhein, Thomas; Schliebe, T. et al.
A special method to create gratings of variable line density by low voltage electron beam lithography
Microelectronic Engineering : an international journal of semiconductor manufacturing technology. Bd. 30. H. 1-4. Amsterdam: Elsevier Science 1996 S. 49 - 52

Schneider, Gerd; Wilhein, Thomas; Niemann, Bastian et al.
X-ray microscopy with high-resolution zone plates : recent developments
Proceedings of SPIE : X-Ray Microbeam Technology and Applications. Bd. 2516. Bellingham, Wash.: SPIE 1995 S. 90 - 101

Thieme, Jürgen; Wilhein, Thomas; Guttmann, Peter et al.
Direct Visulization of Iron+ Manganese Accumulating Microorganisms by X-Ray Microscopy
Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 152 - 156

Schmahl, Günther; Rudolph, Dietbert; Niemann, Bastian et al.
Natural imaging of biological specimens with X-ray microscopes
Chance, Britton (Hrsg). Synchrotron radiation in the biosciences. Oxford [u.a.]: Clarendon Press 1994 7.1

Schmahl, Günter; Guttmann, Peter; Schneider, Gerd et al.
Phase Contrast Studies of Hydrated Specimen with the X-Ray Microscope at BESSY
Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 196 - 206

Schmahl, Günther; Rudolph, Dietbert; Guttmann, Peter et al.
Phase Contrast X-Ray Microscopy
SRN : Synchrotron Radiation News. Bd. 7. H. 4. Philadelphia, Pa.: Taylor & Francis 1994 S. 19 - 22

Wilhein, Thomas; Meyer-Ilse, Werner; Moronne, Mario et al.
Techniques and Applications of X-Ray Microscopy
Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 297 - 303

Wilhein, Thomas; Rothweiler, Dirk; Tusche, Andreas et al.
Thinned back illuminated CCDs for X-Ray Microscopy
Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 470 - 474

Rudolph, Dietbert; Schmahl, Günther A.; Niemann, Bastian et al.
Wet Specimen Imaging with an X-Ray Microscope with a pulsed Plasma Source
Aristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 381 - 386

Thieme, Jürgen; Niemeyer, J.; Guttmann, Peter et al.
X-ray microscopy studies of aqueous colloid systems
Schwuger, M. (Hrsg). Surfactants and colloids in the environment. Darmstadt: Steinkopff 1994 S. 135 - 138

Guttmann, Peter; Schneider, Gerd; Thieme, Jürgen et al.
X-ray microscopy studies with the Goettingen x-ray microscopes
Proceedings of SPIE : Soft X-Ray Microscopy. Bd. 1741. Bellingham, Wash.: SPIE 1993 S. 52 - 61