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Hochschule Koblenz
- Wieland, Marek; Wilhein, Thomas; Kleineberg, Ulf et al.
- Applications of high-harmonic radiation for interferometry and spectroscopy
- Krausz, Ferenc (Hrsg). Ultrafast Optics IV. Berlin [u.a.]: Springer 2004 S. 467 - 474
- Vogt, Ulrich; Wilhein, Thomas; Legall, Herbert et al.
- High resolution x-ray absorption spectroscopy using a laser plasma radiation source
- Review of Scientific Instruments. Bd. 75. H. 11. Melville, NY: AIP 2004 S. 4606 - 4609
- Wieland, Marek; Spielmann, Christian; Westerwalbesloh, Thomas et al.
- Toward time-resolved soft x-ray microscopy using pulsed fs-high-harmonic radiation
- Ultramicroscopy. Bd. 102. H. 2. Amsterdam: Elsevier Science 2005 S. 93 - 100
- Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
- Phase and intensity control through diffractive optical elements in X-ray microscopy
- Journal of Electron Spectroscopy and Related Phenomena : the international journal on theoretical, experimental and applied aspects of electron spectroscopy. Bd. 144-147. New York [u.a.]: Elsevier 2005 S. 957 - 961
- Overbuschmann, Johannes; Hengster, Julia; Irsen, Stephan et al.
- Fabrication of Fresnel zone plates by ion-beam lithography and application as objective lenses in extreme ultraviolet microscopy at 13 nm wavelength
- Optics Letters. Bd. 37. H. 24. Washington, DC: Soc. 2012 S. 5100 - 5102
- Ewald, Johannes; Wilhein, Thomas
- Source Size Characterization of a Microfocus X‐ray Tube Used for In‐Line Phase‐Contrast Imaging
- McNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 81 - 83
- Lenz, Johannes; Krupp, Nikolai; Wilhein, Thomas et al.
- Nanofabrication of Optical Elements for SXR and EUV Applications : Ion Beam Lithography as a New Approach
- McNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 104 - 107
- Benk, Markus P.; Bergmann, Klaus; Querejeta-Fernández, A et al.
- Soft X‐Ray Microscopic Investigation on Self Assembling Nanocrystals
- McNulty, Ian ; Eyberger, Catherine ; Lai, Barry (Hrsg). The 10th International Conference on X-ray Microscopy : Chicago, Illinois, USA ; 15-20 August 2010. Melville, NY: American Institute of Physics 2011 S. 433 - 436
- Heine, Ruth; Gorniak, Thomas; Nisius, Thomas et al.
- Digital in-line X-ray holography with zone plates
- Ultramicroscopy. Bd. 111. H. 8. Amsterdam: Elsevier Science 2011 S. 1131 - 1136
- Lebert, Rainer; Farahzadi, Azadeh; Diete, Wolfgang et al.
- Actinic EUV-mask metrology : tools, concepts, components
- Behringer, Uwe F.W. (Hrsg). Proceedings of SPIE : 27th European Mask and Lithography Conference. Bd. 7985. Dresden: SPIE 2011 79850B