Prof. Dr. rer. nat. Thomas Wilhein
FB Mathematik und Technik, Hochschule Koblenz
- 02642/932-203
- 02642/932-399
Sorge, S.; Wierling, August; Röpke, Gerd et al.
Diagnostics of a laser-induced dense plasma by hydrogen-like carbon spectraJournal of Physics B : atomic, molecular and optical Physics. Bd. 33. H. 16. Bristol: IOP Publ. 2000 S. 2983 - 3000
Schnürer, Matthias; Cheng, Z.; Hentschel, Mario et al.
Few-cycle-driven XUV laser harmonics : generation and focusingApplied Physics : B ; Lasers and optics. Bd. 70. H. Supplement S1. Berlin [u.a.]: Springer 2000 S. 227 - 232
Hertz, Hans M.; Rymell, Lars; Berglund, Magnus et al.
A normal-incidence condenser mirror arrangement for compact water-window x-ray microscopyHoover, Richard B. ; Walker, Arthur B.C. (Hrsg). Proceedings of SPIE : X-ray optics, instruments and missions II. Bellingham, Wash.: SPIE : International Society for Optical Engineering 1999 247
Wilhein, Thomas; Rehbein, Stefan; Hambach, D. et al.
A slit grating spectrograph for quantitative soft x-ray spectroscopyReview of Scientific Instruments. Bd. 70. H. 3. Melville, NY: American Institute of Physics 1999 1694
Fiedorowicz, Henryk; Daido, Hiroyuki; Bartnik, Andrzej et al.
Emission from a gas puff target irradiated with a Nd:YAG laser for EUV and x-ray lithographyVladimirsky, Yuli (Hrsg). Proceedings of SPIE : Emerging Lithographic Technologies III. Bellingham, Wash.: SPIE : International Society for Optical Engineering 1999 400
Kaulich, Burkhard; Oestreich, Sebastian; Salome, M. et al.
Feasibility of transmission x-ray microscopy at 4 keV with spatial resolutions below 150 nmApplied Physics Letters. Bd. 75. H. 26. Melville, NY: American Institute of Physics 1999 4061
Teubner, Ulrich; Wagner, U.; Oberschmidt, David et al.
High Brightness X-Radiation and Plasma Frequency Emission from Femtosecond Laser PlasmasOptical Society of America : OSA (Hrsg). Applications of High Field and Short Wavelength Sources VIII. Washington, DC. 1999 WA3
Fiedorowicz, Henryk; Bartnik, Andrzej; Szczurek, Mirosław et al.
Investigation of soft X-ray emission from a gas puff target irradiated with a Nd: YAG laserOptics Communications. Bd. 163. H. 1-3. Amsterdam: Elsevier 1999 S. 103 - 114
Doron, R.; Behar, E.; Mandelbaum, P. et al.
Spectroscopic signature of strong dielectronic recombination in highly ionized xenon produced by irradiating a gas puff with laserPhysical review : A ; atomic, molecular and optical physics. Bd. 59. H. 1. College Park, MD: American Physical Society 1999 S. 188 - 194
Berglund, Magnus; Rymell, Lars; Hertz, Hans M. et al.
Cryogenic liquid-jet target for debris-free laser-plasma soft x-ray generationReview of Scientific Instruments : RSI. Bd. 69. H. 6. Melville, NY: American Institute of Physics 1998 S. 2361 - 2364
Wilhein, Thomas
Investigations on Laser-Generated Plasma SourcesThieme, Jürgen (Hrsg). X-Ray Microscopy and Spectromicroscopy : Part V. Berlin [u.a.]: Springer 1998 S. 373 - 383
Lebert, R; Schriever, G; Wilhein, Thomas et al.
Soft x-ray emission of laser-produced plasmas using a low-debris cryogenic nitrogen targetJournal of Applied Physics. Bd. 84. H. 6. Melville, NY: American Institute of Physics 1998 S. 3419 - 3421
Wilhein, Thomas; Altenbernd, D.; Teubner, U. et al.
X-ray brilliance measurements of a subpicosecond laser plasma using an elliptical off-axis reflection zone plateJournal of the Optical Society of America : JOSA ; B : Optical physics. Bd. 15. H. 3. Washington, DC: Optical Society of America 1998 S. 1235 - 1241
Fiedorowicz, Henryk; Bartnik, Andrzej; Jarocki, Roman et al.
X-ray emission in the ‘water window’ from a nitrogen gas puff target irradiated with a nanosecond Nd:glass laser pulseApplied Physics : B ; Lasers and optics. Bd. 67. H. 3. New York [u.a.]: Springer 1998 S. 391 - 393
Wilhein, Thomas; Hambach, D.; Niemann, Bastian et al.
Off-axis reflection zone plate for quantitative soft x-ray source characterizationApplied Physics Letters. Bd. 71. H. 2. Woodbury, NY: American Institute of Physics 1997 S. 190 - 192
Niemann, Bastian; Wilhein, Thomas; Schliebe, T. et al.
A special method to create gratings of variable line density by low voltage electron beam lithographyMicroelectronic Engineering : an international journal of semiconductor manufacturing technology. Bd. 30. H. 1-4. Amsterdam: Elsevier Science 1996 S. 49 - 52
Schneider, Gerd; Wilhein, Thomas; Niemann, Bastian et al.
X-ray microscopy with high-resolution zone plates : recent developmentsProceedings of SPIE : X-Ray Microbeam Technology and Applications. Bd. 2516. Bellingham, Wash.: SPIE 1995 S. 90 - 101
Thieme, Jürgen; Wilhein, Thomas; Guttmann, Peter et al.
Direct Visulization of Iron+ Manganese Accumulating Microorganisms by X-Ray MicroscopyAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 152 - 156
Schmahl, Günther; Rudolph, Dietbert; Niemann, Bastian et al.
Natural imaging of biological specimens with X-ray microscopesChance, Britton (Hrsg). Synchrotron radiation in the biosciences. Oxford [u.a.]: Clarendon Press 1994 7.1
Schmahl, Günter; Guttmann, Peter; Schneider, Gerd et al.
Phase Contrast Studies of Hydrated Specimen with the X-Ray Microscope at BESSYAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 196 - 206
Schmahl, Günther; Rudolph, Dietbert; Guttmann, Peter et al.
Phase Contrast X-Ray MicroscopySRN : Synchrotron Radiation News. Bd. 7. H. 4. Philadelphia, Pa.: Taylor & Francis 1994 S. 19 - 22
Wilhein, Thomas; Meyer-Ilse, Werner; Moronne, Mario et al.
Techniques and Applications of X-Ray MicroscopyAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 297 - 303
Wilhein, Thomas; Rothweiler, Dirk; Tusche, Andreas et al.
Thinned back illuminated CCDs for X-Ray MicroscopyAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 470 - 474
Rudolph, Dietbert; Schmahl, Günther A.; Niemann, Bastian et al.
Wet Specimen Imaging with an X-Ray Microscope with a pulsed Plasma SourceAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 381 - 386
Thieme, Jürgen; Niemeyer, J.; Guttmann, Peter et al.
X-ray microscopy studies of aqueous colloid systemsSchwuger, M. (Hrsg). Surfactants and colloids in the environment. Darmstadt: Steinkopff 1994 S. 135 - 138