Prof. Dr. rer. nat. Thomas Wilhein
FB Mathematik und Technik, Hochschule Koblenz
- 02642/932-203
- 02642/932-399
Schmahl, Günther; Rudolph, Dietbert; Guttmann, Peter et al.
Phase Contrast X-Ray MicroscopySRN : Synchrotron Radiation News. Bd. 7. H. 4. Philadelphia, Pa.: Taylor & Francis 1994 S. 19 - 22
Wilhein, Thomas; Meyer-Ilse, Werner; Moronne, Mario et al.
Techniques and Applications of X-Ray MicroscopyAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 297 - 303
Wilhein, Thomas; Rothweiler, Dirk; Tusche, Andreas et al.
Thinned back illuminated CCDs for X-Ray MicroscopyAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 470 - 474
Rudolph, Dietbert; Schmahl, Günther A.; Niemann, Bastian et al.
Wet Specimen Imaging with an X-Ray Microscope with a pulsed Plasma SourceAristov, V. (Hrsg). X-ray microscopy IV. Chernogolovka: Institute of Microelectronics Technology 1994 S. 381 - 386
Thieme, Jürgen; Niemeyer, J.; Guttmann, Peter et al.
X-ray microscopy studies of aqueous colloid systemsSchwuger, M. (Hrsg). Surfactants and colloids in the environment. Darmstadt: Steinkopff 1994 S. 135 - 138
Guttmann, Peter; Schneider, Gerd; Thieme, Jürgen et al.
X-ray microscopy studies with the Goettingen x-ray microscopesProceedings of SPIE : Soft X-Ray Microscopy. Bd. 1741. Bellingham, Wash.: SPIE 1993 S. 52 - 61