Prof. Dr. habil. Steffen Wendzel
ZFT | Zentrum für Forschung und Technologie, Hochschule Worms
Wendzel, Steffen; Wressnegger, Christian; Hartmann, Laura et al.
Sicherheit 2024: Beiträge der 12. Jahrestagung des Fachbereichs Sicherheit der Gesellschaft für Informatik e.V. (GI)Bonn. 2024 306 S. (LNI P-345)
Wendzel, Steffen; Caviglione, Luca; Mazurczyk, Wojciech
Avoiding Research Tribal Wars Using TaxonomiesComputer. Bd. 56. H. 1. Institute of Electrical and Electronics Engineers (IEEE) 2023 S. 93 - 96 10008941
Schorr, Victoria; Kamenev, Nikolai; Bleistein, Thomas et al.
Power Consumption Analysis as a Detection Indicator for Cyberattacks on Smart Home DevicesEnergy Informatics. Bern: Springer 2023 S. 224 - 239
Mileva, Aleksandra; Wendzel, Steffen; Franqueira, Virginia
Proceedings of the 2023 European Interdisciplinary Cybersecurity Conference: Stavanger, NorwayEICC. New York: ACM 2023
Aehle, M.; Alme, J.; Barnaföldi, G.G. et al.
The Bergen proton CT systemJournal of Instrumentation. Bd. 18. H. 2. IOP Publishing 2023 2051
Schilling, Alexander; Aehle, Max; Alme, Johan et al.
Uncertainty-aware spot rejection rate as quality metric for proton therapy using a digital tracking calorimeterPhysics in Medicine & Biology. Bd. 68. H. 19. IOP Publishing 2023 194001
Zillien, Sebastian; Wendzel, Steffen
Weaknesses of popular and recent covert channel detection methods and a remedyIEEE Transactions on Dependable and Secure Computing. Bd. 20. H. 6. Institute of Electrical and Electronics Engineers (IEEE) 2023 S. 5156 - 5157
Lenz, Julia; Bozakov, Zdravko; Wendzel, Steffen et al.
Why People Replace their Aging Smart Devices: A Push–Pull–Mooring PerspectiveComputers & Security. Bd. 130. Elsevier B.V. 2023 103258
Wendzel, Steffen; Caviglione, Luca; Mazurczyk, Wojciech et al.
A Generic Taxonomy for Steganography MethodsNew York: Institute of Electrical and Electronics Engineers (IEEE) 2022 (TechRxiv)
Szary, Przemyslaw; Mazurczyk, Wojciech; Wendzel, Steffen et al.
Analysis of Reversible Network Covert ChannelsIEEE Access. Bd. 10. Institute of Electrical and Electronics Engineers (IEEE) 2022 S. 41226 - 41238
