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JGU Mainz (85463)
HS Koblenz (5518)
5518 Treffer
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Hochschule Koblenz
- Wieland, Marek; Früke, Rolf; Wilhein, Thomas et al.
- Sub-micron imaging in the EUV-spectral range using high-harmonic radiation
- Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 149 - 152
- Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
- Design and Fabrication of new optics for X-ray microscopy and material sciences
- Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 177 - 183
- Kaulich, Burkhard; Susini, Jean; David, Christian et al.
- Twinmic : a European twin microscope station combining full-field imaging and scanning microscopy
- Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 103 - 107
- Di Fabrizio, Enzo; Cabrini, Stefano; Cojoc, Dan et al.
- Shaping X-rays by diffractive coded nano-optics
- Microelectronic Engineering : an international journal of semiconductor manufacturing technology. Bd. 67-68. H. 1. Amsterdam: Elsevier 2003 S. 87 - 95
- Wilhein, Thomas; Kaulich, Burkhard; Di Fabrizio, Enzo et al.
- Differential Interference Contrast X-ray Microscopy at ESRF Beamline ID 21
- Journal de Physique IV : Proceedings. Bd. 104. H. 3. Les Ulis: EDP Sciences 2003 S. 535 - 541
- Wieland, Marek; Wilhein, Thomas; Spielmann, Christian et al.
- Zone plate interferometry at 13 nm wavelength
- Applied Physics : B ; Lasers and optics. Bd. 76. H. 8. Berlin [u.a.]: Springer 2003 S. 885 - 889
- Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
- Diffractive optical elements for differential interference contrast x-ray microscopy
- Optics Express. Bd. 11. H. 19. Washington, DC: Soc. 2003 S. 2278 - 2288
- Di Fabrizio, Enzo; Cojoc, Dan; Cabrini, Stefano et al.
- Nano-optical elements fabricated by e-beam and x-ray lithography
- Proceedings of SPIE : Nano- and Micro-Optics for Information Systems. Bd. 5225. Bellingham, Wash.: SPIE 2003 S. 113 - 125
- Kaulich, Burkhard; Susini, Jean; David, Christian et al.
- TwinMic : combined Scanning and Full-field Imaging Microscopy with Novel Contrast Mechanisms
- SRN : Synchrotron Radiation News. Bd. 16. H. 3 : Special Issue " X‐ray Microscopy". Philadelphia, Pa.: Taylor & Francis 2003 S. 49 - 52
- Vogt, Ulrich; Frueke, Rolf; Wilhein, Thomas et al.
- High-resolution spatial characterization of laser produced plasmas at soft x-ray wavelengths
- Applied Physics : B ; Lasers and optics. Bd. 78. H. 1. Berlin [u.a.]: Springer 2004 S. 53 - 58