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GreyCat: A Framework to Develop Digital Twins at Large ScaleProceedings of the ACM/IEEE 27th International Conference on Model Driven Engineering Languages and Systems. Linz, Austria: ACM 2024 S. 492 - 495
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CalcGraph: taming the high costs of deep learning using modelsSoftware and Systems Modeling. Bd. 22. H. 4. Springer Science and Business Media LLC 2023 S. 1151 - 1174
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Industrial defect detection on the edge with deep learning over scarcely labeled and extremely imbalanced data2023 IEEE International Conference on Omni-layer Intelligent Systems (COINS). Berlin, Germany: IEEE 2023 S. 1 - 6
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Profiling the real world potential of neural network compression2022 IEEE International Conference on Omni-layer Intelligent Systems (COINS). Barcelona, Spain: IEEE 2022 S. 1 - 6
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Explaining Defect Detection with Saliency MapsAdvances and Trends in Artificial Intelligence. From Theory to Practice. Kuala Lumpur, Malaysia: Springer International Publishing 2021 S. 506 - 518
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