0009-0007-4098-1244
Schuler, Nicolas; Dewald, Lea; Graf, Jürgen
Keeping it Local, Tiny and Real: Automated Report Generation on Edge Computing Devices for Mechatronic-Based Cognitive Systems
Plassmann, Jessica; Schuler, Nicolas; Schuth, Michael et al.
Automated Annotation of Shearographic Measurements Enabling Weakly Supervised Defect DetectionCornell University (Hrsg). arXiv. online: arXiv 2025 11 S.
Schuler, Nicolas; Dewald, Lea; Baldig, Nick et al.
From the Laboratory to Real-World Application: Evaluating Zero-Shot Scene Interpretation on Edge Devices for Mobile RoboticsBramer, Max; Stahl, Frederic (Hrsg). Artificial Intelligence XLII. Springer Nature Switzerland 2025 S. 301 - 315 (Lecture Notes in Computer Science (Volume 16302))
Plassmann, Jessica; Schuler, Nicolas; von Freymann, Georg et al.
Unsupervised Learning for Industrial Defect Detection: A Case Study on Shearographic DataBramer, Max; Stahl, Frederic (Hrsg). Artificial Intelligence XLII. Springer Nature 2025 S. 316 - 329 (Lecture Notes in Computer Science, Volume 16302)
Plaßmann, Jessica; von Freymann, Georg; Schuth, Michael et al.
Entwicklung eines ganzheitlichen Automationsansatzes für die Speckle-interferometrischen Verfahren der Digital-Holografie und -ShearografieTagungsband HAW-Forschungstag. 2024 S. 63 - 65
Schuler, Nicolas; Hoffmann, Maximilian; Beise, Hans-Peter et al.
Semi-supervised similarity learning in process-oriented case-based reasoningBramer, Max; Stahl, Frederic (Hrsg). Artificial Intelligence XL : SGAI International Conference on Artificial Intelligence (AI-2023). Cham: Springer Nature Switzerland 2023 S. 159 - 173
Schuler, Nicolas; Hoffmann, Maximilian; Beise, Hans-Peter et al.
Semi-supervised Similarity Learning in Process-Oriented Case-Based Reasoning.SGAI Conf. 2023 S. 159 - 173