Prof. Dr. Hildegard Möbius
Fachbereich Informatik und Mikrosystemtechnik, Hochschule Kaiserslautern
- 0631/3724-5412
- 0631/3724-5313
Lehnert, Lukas; Helgest, Lars; Baumann, Benjamin et al.
Exploiting the interaction area limitation in Electrostatic Force Microscopy for dielectric measurements of nanoparticlesMicro and Nano Engineering. Elsevier BV 2026 S. 100394
Lehnert, Lukas; Thoelen, Ronald; Möbius, Hildegard
Revisiting contact potential difference in electrostatic force microscopyJournal of Physics Communications. Bd. 10. H. 1. IOP Publishing 2026 S. 015007
Sachs, Ian; Fuhrmann, Marc; Deferme, Wim et al.
Determination of Layer Morphology of Rough Layers in Organic Light Emitting Diodes by X‐Ray ReflectivityEngineering Reports. Bd. 0. John Wiley & Sons 2022 12594
Fuhrmann, Marc; Musyanovych, Anna; Thoelen, Ronald et al.
Determination of the dielectric constant of non-planar nanostructures and single nanoparticles by electrostatic force microscopyJournal of Physics Communications. Bd. 6. H. 12. IOP 2022 125005
Sachs, Ian; Fuhrmann, Marc; Verboven, Inge et al.
Inkjet Printed Lenses with Adjustable Contact Angle to Improve the Light Out‐Coupling of Organic Light Emitting DiodesAdvanced Engineering Materials. Bd. 23. H. 9. Wiley 2021 S. 1 - 25
Oudebrouckx, Gilles; Nieder, Daniel; Vandenryt, Thijs et al.
Single element thermal sensor for measuring thermal conductivity and flow rate inside a microchannelSensors and Actuators A: Physical. Bd. 331. Elsevier BV 2021 S. 112906
Fuhrmann, Marc; Musyanovych, Anna; Thoelen, Ronald et al.
Magnetic Imaging of Encapsulated Superparamagnetic Nanoparticles by Data Fusion of Magnetic Force Microscopy and Atomic Force Microscopy Signals for Correction of Topographic CrosstalkNanomaterials. Bd. 10. H. 12. Basel: MDPI AG 2020 S. 2486
Fuhrmann, Marc; Krivcov, Alexander; Musyanovych, Anna et al.
The Role of Nanoparticles on Topographic Cross‐Talk in Electric Force Microscopy and Magnetic Force Microscopyphysica status solidi (a). Bd. 217. H. 13. Wiley 2020 S. 1900828
Krivcov, Alexander; Ehrler, Jasmin; Fuhrmann, Marc et al.
Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopyBeilstein Journal of Nanotechnology. Bd. 10. Beilstein Institut 2019 S. 1056 - 1064
Krivcov, Alexander; Schneider, Jennifer; Junkers, Tanja et al.
Magnetic Force Microscopy of in a Polymer Matrix Embedded Single Magnetic Nanoparticles (Phys. Status Solidi A 12∕2019)physica status solidi (pss). Bd. 216. H. 12. Wiley-VCH GmbH, Weinheim 2019 S. 1970041