FB 08 - Physik, Mathematik und Informatik
Johannes Gutenberg-Universität Mainz
- 06131/39-2270
- 06131/39-4389
Palberg, Thomas; Overbeck, E.; Sinn, C. et al.
Probing dynamics of dense suspensions : three-dimensional cross correlation techniqueColloids and Surfaces : A. Bd. 122. H. 1-3. 1997 S. 83 - 87
Jourdan, Martin; Huth, M.; Mouloud, S. et al.
Probing the superconducting state of UPd2Al3 thin films by tunneling spectroscopyPhysica C. Bd. 282/287. H. 3. 1997 S. 1883 - 1884
Jourdan, Martin; Huth, M.; Hessert, J. et al.
Superconducting tunneling spectroscopy on epitaxial UPd2Al3 thin filmsPhysica B. Bd. 230/232. 1997 S. 335 - 337
Hessert, J.; Huth, M.; Jourdan, Martin et al.
Temperature and angular dependence of the upper critical field of UPd2Al3 thin filmsPhysica B. Bd. 230/232. 1997 S. 373 - 376
Aulenbacher, K; Nachtigall, C; Andresen, HG et al.
The MAMI source of polarized electronsNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. Bd. 391. H. 3. 1997 S. 498 - 506
Haibach, P.; Frey, U.; Adrian, Hermann et al.
Transversal thermovoltages of (1 1 9) Bi2Sr2CaCu2O8+δ thin films on vicinal (1 1 0) SrTiO3 substratesPhysica C. Bd. 282/287. H. 2. 1997 S. 655 - 656
Holiastou, M.; Poulakis, N.; Palles, D. et al.
XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin filmsPhysica C. Bd. 282/287. H. 2. 1997 S. 583 - 584
Mrowka, F.; Wurlitzer, M.; Esquinazi, P. et al.
Ac field dependence of the susceptibility of Bi2Sr2CaCu2O8 thin films at low dc fieldsCzechoslovak journal of physics. Bd. 46. H. 2. 1996 S. 1101 - 1102
Bischof, J.; Reinmuth, M.; Boneberg, Johannes et al.
Behavior of thin metallic films upon melting with an ns-laser pulsProkhorov, Alexander M. (Hrsg). ALT'95 international symposium on advanced materials for optics and optoelectronics : proceedings (SPIE proceedings series ; 2777). 1996 S. 119 - 127
Adrian, Hermann; Frey, U.; Meffert, H. et al.
Bi2Sr2Ca2Cu3O10 ? based Josephson junctions and SQUIDsCzech. J. Phys. Bd. 46. 1996 S. 1289 - 1290