FB 08 - Physik, Mathematik und Informatik
Johannes Gutenberg-Universität Mainz
- 06131/39-2270
- 06131/39-4389
Aulenbacher, K; Nachtigall, C; Andresen, HG et al.
The MAMI source of polarized electronsNUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT. Bd. 391. H. 3. 1997 S. 498 - 506
Haibach, P.; Frey, U.; Adrian, Hermann et al.
Transversal thermovoltages of (1 1 9) Bi2Sr2CaCu2O8+δ thin films on vicinal (1 1 0) SrTiO3 substratesPhysica C. Bd. 282/287. H. 2. 1997 S. 655 - 656
Holiastou, M.; Poulakis, N.; Palles, D. et al.
XRD and micro Raman characterization of epitaxial Bi-2201, Bi-2212 and Bi-2223 thin filmsPhysica C. Bd. 282/287. H. 2. 1997 S. 583 - 584
Mrowka, F.; Wurlitzer, M.; Esquinazi, P. et al.
Ac field dependence of the susceptibility of Bi2Sr2CaCu2O8 thin films at low dc fieldsCzechoslovak journal of physics. Bd. 46. H. 2. 1996 S. 1101 - 1102
Bischof, J.; Reinmuth, M.; Boneberg, Johannes et al.
Behavior of thin metallic films upon melting with an ns-laser pulsProkhorov, Alexander M. (Hrsg). ALT'95 international symposium on advanced materials for optics and optoelectronics : proceedings (SPIE proceedings series ; 2777). 1996 S. 119 - 127
Frey, U.; Meffert, H.; Haibach, P. et al.
Bi2Sr2Ca2Cu3O10+δ based Josephson junctions and SQUIDsCzechoslovak Journal of Physics. Bd. 46. 1996 S. 1289 - 1290
Li, R.; Sherman, E.; Feile, R. et al.
Charge transfer in high-Tc (Y/Pr)Ba2Cu3O7 superlatticesPhysical review B. Bd. 53. H. 10. 1996 S. 6836 - 6837
Peise, Jörg; Hünger, A.; Ahrens, Jürgen et al.
Compton scattering by the proton through theta(cms)=75 degrees in the Delta-resonance regionPhysics letters : B. Bd. 384. H. 1-4. Amsterdam: Elsevier 1996 S. 37 - 42
Selke, O.; Hünger, A.; Kraus, A. et al.
Compton scattering from He-4 in the Delta(1232) resonance regionPhysics letters : B. Bd. 369. H. 3-4. 1996 S. 207 - 210
Frank, H.; Lethen, J.; Buschmann, L. et al.
Dimensional crossover in the pinning of heavy-ion irradiated Bi-2212 filmsPhysica C. Bd. 259. H. 1/2. 1996 S. 142 - 150