FB 08 - Physik, Mathematik und Informatik
Johannes Gutenberg-Universität Mainz
- 06131/39-2270
- 06131/39-4389
Kluge, T.; Jakob, Gerhard; Speckmann, M. et al.
Finite range scattering of Ni and Zn impurities in Y-123 thin filmsPhysica C. Bd. 282/287. H. 2. 1997 S. 669 - 670
Neser, S.; Bechinger, C.; Leiderer, P. et al.
Finite Size Effects on the closest Packing of Hard SpheresPhys. Rev. Lett. Bd. 79. 1997 S. 2348 - 2351
Derber, S.; Palberg, Thomas; Schätzel, K. et al.
Growth of a colloidal crystallite of hard spherePhysica : A. Bd. 235. H. 1-2. 1997 S. 204 - 215
Garbow, Norber; Müller, Jürgen; Schätzel, Klaus et al.
High resolution particle sizing by optical tracking of single colloidal particlesPhysica A. Bd. 235. 1997 S. 291 - 305
Wienss, A.; Jakob, Gerhard; Voss-de Haan, P. et al.
History dependence of the magnetization of thin HTSC films : an explanation for distorted SQUID signalsPhysica : C, Superconductivity. Bd. 280. H. 3. 1997 S. 158 - 166
Schattke, A.; Jakob, Gerhard; Martinez, J. C. et al.
Investigations on the c-axis transport properties of YBa2Cu3O7-delta/PrBa2Cu3O7-delta thin film superlatticesIEEE Transactions on applied superconductivity. Bd. 7. H. 2. 1997 S. 2727 - 2729
Beck, Reinhard; Krahn, Hans-Peter; Ahrens, Jürgen et al.
Measurement of the E2/M1 ratio in the N->delta transition using the reaction p((gamma)over-right-arrow,p)pi(0)Physical review letters. Bd. 78. H. 4. College Park, MD: APS 1997 S. 606 - 609
Beck, Reinhard; Krahn, Hans-Peter; Ahrens, Jürgen et al.
Measurement of the E2/M1 ratio in the N→delta transition using the reaction p((gamma)over-right-arrow,p)pi(0)Physical review letters. Bd. 79. H. 22. College Park, MD: APS 1997 S. 4515
Palberg, Thomas
Optical methods and physics of colloidal dispersions : International Workshop on Optical Methods and the Physics of Colloidal Dispersions <1996, Mainz>Darmstadt: Steinkopff 1997 202 S. (Progress in colloid & polymer science ; 104)
Holiastou, M.; Psyharis, V.; Niarchos, D. et al.
Preparation and x-ray pole-figure characterization of DC-sputtered Bi-2201, Bi-2212 and Bi-2223 thin filmsSuperconductor science and technology. Bd. 10. 1997 S. 712 - 716