Institut für Physik
FB 08 - Physik, Mathematik und Informatik / Johannes Gutenberg-Universität Mainz
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Palberg, Thomas; Heymann, A.; Sinn, Chr.
Particle characterization using multiple scattering decorrelation methods : hard sphere model systemsPhysical review : E. Bd. 62. H. 1. 2000 S. 813 - 820
Martinez, J. C.; Schattke, A.; Jakob, Gerhard et al.
Perpendicular transport properties of YBa2Cu3O7−δ/PrBa2Cu3O7−δ superlatticesPhysica B: Condensed Matter. Bd. 284-288. 2000 S. 553 - 554
Adrian, Hermann; Xiao, Z.L.; Jakob, G. et al.
Preparation and characterization of (Hg0.7Mo0.3)Sr2(Ca0.7Y0.3)Cu2Ox and (Hg0.9Re0.1)Ba2CaCu2Oy superconducting films by laser ablationPhysica C. Bd. 341-348. 2000 S. 2393 - 2394
Dressel, M.; Gorshunov, B.; Kasper, N. et al.
Pseudogap in the optical spectra of UPd2Al3J. of Physics: Cond. Matter. Bd. 12. H. 40. 2000 S. 633 - 640
Haibach, P.; Huth, M.; Adrian, Hermann
Step-edge induced anisotropic domain-wall propagationPhysical review letters. Bd. 84. H. 6. 2000 S. 1312 - 1315
Huth, M.; Jourdan, Martin; Adrian, Hermann
Strong-coupling effects in the heavy-fermion superconductor UPd2Al3Physica B. Bd. 281/282. 2000 S. 882 - 887
Palberg, Thomas; Evers, M.; Dingenouts, N. et al.
Vitrification in restricted geometry : dry films of colloidal particlesProgress in colloid & polymer science. Bd. 115. 2000 S. 307 - 314
Kretzschmar, Martin
A quantum mechanical model of Rabi oscillations between two interacting harmonic oscillator modes and the interconversion of modes in a Penning trapDubin, Daniel H. E.; Schneider, Dieter (Hrsg). Trapped Charged Particles and Fundamental Physics. Woodbury / New York. 1999 S. 242 - 251 (AIP Conference Proceedings, Bd. 457)
Hillmer, F.; Jakob, Gerhard; Haibach, P. et al.
Absence of correlated flux pinning by columnar defects in irradiated epitaxial Bi2Sr2CaCu2O8 thin filmsPhysica C. Bd. 311. H. 1-2. 1999 S. 11 - 18
Miu, L.; Jakob, Gerhard; Adrian, Hermann
Comment on "nonlocal in-plane resistance due to vortex-antivortex dynamics in high- Tc superconducting films"Physical review letters. Bd. 82. H. 3. 1999 S. 672