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- Acharya, S.; Acosta, F.-T.; Keidel, R. et al.
- ϕ meson production at forward rapidity in Pb-Pb collisions at sNN‾‾‾‾√=2.76 TeV
- The European Physical Journal C. Bd. 78. H. 7. Springer Nature 2018 S. 1 - 26
- Acharya, S.; Acosta, F. T.; Keidel, Ralf et al.
- Energy dependence and fluctuations of anisotropic flow in Pb-Pb collisions at sNN‾‾‾‾√=5.02 and 2.76 TeV
- arXiv.org e-print Archiv (Hrsg). Genf, Schweiz. 2018 S. 1 - 37
- Acharya, S.; Acosta, F. T.; Keidel, Ralf et al.
- Direct photon production at low transverse momentum in proton-proton collisions at s√=2.76 and 8 TeV
- arXiv.org e-pront Archiv (Hrsg). Genf, Schweiz. 2018 S. 1 - 27
- Acharya, S.; Acosta, F. T.; Keidel, Ralf et al.
- Neutral pion and η meson production at mid-rapidity in Pb-Pb collisions at sNN‾‾‾‾√ = 2.76 TeV
- arXiv.org e-print Archiv (Hrsg). Genf, Schweiz. 2018 S. 1 - 27
- Acharya, S.; Acosta, F. T.; Keidel, Ralf et al.
- Transverse momentum spectra and nuclear modification factors of charged particles in pp, p-Pb and Pb-Pb collisions at the LHC
- arXiv.org e-print Archiv (Hrsg). Genf, Schweiz. 2018 S. 1 - 27
- Acharya, S.; Acosta, F. T.; Keidel, Ralf et al.
- Neutral pion and η meson production in p-Pb collisions at sNN‾‾‾‾√=5.02 TeV
- arXiv.org e-print Archiv (Hrsg). Genf, Schweiz. 2018 S. 1 - 34
- Frash Jr., Robert E.; Blose, Julia E.; Smith, Wayne W. et al.
- A multidisciplinary marketing profile of motorcycle tourists: explorers escaping routine to find flow on scenic routes
- Tourism Recreation Research. Bd. 2018/07/09. Informa UK Limited 2018 S. 1 - 13
- Scherhag, Knut
- Edition Wattenmeer - Eine Kooperation zwischen Weinhandel und regionaler Tourismuswirtschaft
- Scherhag, Knut (Hrsg). Weintourismus und Marketing. 1. Aufl. Lohmar - Köln: Eul 2013 S. 93 - 107
- Jäger, Lars; Abdin, Nura
- Die Abschaffung des kostenlosen Girokontos - Eine empirische Analyse
- 1. Aufl. Norderstedt: BOD Verlag 2018 136 S.
- Cabaj, Krzysztof; Caviglione, Luca; Mazurczyk, Wojciech et al.
- The New Threats of Information Hiding: The Road Ahead
- IT Professional. Bd. 20. H. 3. Institute of Electrical and Electronics Engineers (IEEE) 2018 S. 31 - 39