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- Krieger, Rolf; Schorr, Christian
- A Reference Model for Product Data Profiling in Retail ERP Systems
- Proceedings of the 8th International Conference on Data Science, Technology and Applications. Portugal: SCITEPRESS - Science and Technology Publications 2019
- Becker, B.; Hahn, R.; Krieger, R. et al.
- Structure based methods for parallel pattern fault simulation in combinational circuits
- Proceedings of the European Conference on Design Automation. Amsterdam: IEEE 1991 S. 497 - 502
- Becker, B.; Hahn, R.; Krieger, R.
- Fast fault simulation in combinational circuits: An efficient data structure, dynamic dominators and refined check-up
- Proceedings of the European Design Automation Conference (EURO-DAC). USA: IEEE 2003
- Becker, B.; Krieger, R.
- FAST-SC: Fast Fault Simulation in Synchronous Sequential circuits
- The Sixth International Conference on VLSI Design. online: IEEE 2005
- Krieger, R.
- PLATO: A Tool for Computation of Exact Signal Probabilities
- The Sixth International Conference on VLSI Design. online: IEEE 2005
- Becker, Bernd; Drechsler, Rolf; Hengster, Harry et al.
- Binary Decision Diagrams and Testing
- In GI/ITG Workshop 'Testmethoden und Zuverlässigkeit von Schaltungen und Systemen'. Freiberg. 1993
- Krieger, R.; Becker, B.; Sinkovic, R.
- A BDD-based algorithm for computation of exact fault detection probabilities
- The Twenty-Third International Symposium on Fault-Tolerant Computing (FTCS). Toulouse: IEEE 1993 S. 186 - 195
- Hahn, R.; Krieger, R.; Becker, B.
- A hierarchical approach to fault collapsing
- Proceedings of European Design and Test Conference (EDAC-ETC-EUROASIC). Paris: IEEE 1994 S. 171 - 176
- Krieger, R.; Becker, B.; Keim, M.
- A hybrid fault simulator for synchronous sequential circuits
- Proceedings, International Test Conference. Washington: IEEE 1994 S. 614 - 623
- Krieger, R.; Becker, B.; Okmen, C.
- OBDD-based optimization of input probabilities for weighted random pattern generation
- Twenty-Fifth International Symposium on Fault-Tolerant Computing: Digest of Papers. Pasadena: IEEE 1995 S. 120 - 129