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101007 Treffer
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Johannes Gutenberg-Universität Mainz
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Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau
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Hochschule Worms
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Hochschule Koblenz
- Pietz, Sebastian; Kolbenschlag, Sara; Röder, Nina et al.
- Subsidy Quality Affects Common Riparian Web‐Building Spiders: Consequences of Aquatic Contamination and Food Resource
- Environmental Toxicology and Chemistry. Bd. 42. H. 6. Wiley 2023 S. 1346 - 1358
- Šudomová, Lucie; Doležalová Weissmannová, Helena; Steinmetz, Zacharias et al.
- A differential scanning calorimetry (DSC) approach for assessing the quality of polyethylene terephthalate (PET) waste for physical recycling: A proof-of-concept study
- Journal of Thermal Analysis and Calorimetry. Bd. 148. H. 20. Springer 2023 S. 10843 - 10855
- Buchmann, Christian; Neff, Janina; Meyer, Maximilian et al.
- Superabsorbent polymers in soil: The new microplastics?
- Cambridge Prisms: Plastics. Bd. 2. H. e3. Cambridge University Press (CUP) 2024 S. 1 - 14
- Alessandro, Nai; Maier, Jürgen
- Polarized Populists: Dark Campaigns, Affective Polarization, and the Moderating Role of Populist Attitudes
- American Behavioral Scientist. Bd. 0. 2024 S. 1 - 30
- Steinmetz, Zacharias; Schröder, Heike
- Plastic debris in plastic-mulched soil: A screening study from western Germany
- PeerJ. Bd. 10. PeerJ 2022 13781
- Schneider, Armin
- "Ergänzungs-"-Kräfte: Notlösung oder Bereicherung?
- Kita Aktuell HRS. Bd. 1/2024. Köln: Carl Link 2024 S. 14 - 16
- Prof. Dr. Andranik Tumasjan
- Johannes Gutenberg-Universität Mainz
- Transferbündnis EMPOWER – Teilprojekt der HS Worms (Cyber Security)
- Wendzel, Steffen; Hartmann, Laura; Weigold, Thomas; Bozakov, Zdravko; Röckle, Haio; Schlüter, Martin; Weiß-Wittstadt, Susanne; Körner, Florian; Kurpjuweit, Stephan; Wackrow, Rene; Jeppe, Kerstin; Bub, Daniel; (2023 - 2027)
- Dr. phil. Sven Kachel
- Rheinland-Pfälzische Technische Universität Kaiserslautern-Landau
- Zillien, Sebastian; Wendzel, Steffen
- Weaknesses of popular and recent covert channel detection methods and a remedy
- IEEE Transactions on Dependable and Secure Computing. Bd. 20. H. 6. Institute of Electrical and Electronics Engineers (IEEE) 2023 S. 5156 - 5157