0000-0002-8774-6141
Bosse, Stefan; Lüssem, Björn
Analog Electronic Neural Networks: Analog Computing Combined with Digital Data Processing RevisitedStefano Mariani; Francisco Falcone; Stefan Bosse; Jean-Marc Laheurte (Hrsg). The 11th International Electronic Conference on Sensors and Applications. Basel: MDPI 2024 17 S.
Bosse, Stefan; Lehmhus, Dirk; Kumar, Sanjeev
Automated Porosity Characterization for Aluminum Die Casting Materials Using X-ray Radiography, Synthetic X-ray Data Augmentation by Simulation, and Machine LearningSensors. Bd. 24. H. 9. Basel: MDPI 2024
Polle, Christoph; Bosse, Stefan; Herrmann, Axel S.
Damage Location Determination with Data Augmentation of Guided Ultrasonic Wave Features and Explainable Neural Network Approach for Integrated Sensor SystemsComputers. Bd. 13. H. 2. Basel: MDPI 2024
Bosse, Stefan
Data-driven Parameterizable Generative Adversarial Networks for Synthetic Data Augmentation of Guided Ultrasonic Wave Sensor SignalsC. Boller; M. Buderath; S. Dehlau; E. Niederleithinger; J. Prager; P. Wierach (Hrsg). Proceedings of the 11th European Workshop on Structural Health Monitoring (EWSHM 2024), June 10-13, 2024 in Potsdam, Germany. Mayen: NDT.net 2024 15 S.
Mariani, Stefano (Hrsg.); Falcone, Francisco (Hrsg.); Bosse, Stefan (Hrsg.) et al.
The 11th International Electronic Conference on Sensors and ApplicationsBasel: MDPI 2024
Polle, Christoph; May, David; Bosse, Stefan
Transformation of Guided Ultrasonic Wave Signals from Air Coupled to Surface Bounded Measurement Systems with Machine Learning Algorithms for Training Data AugmentationEngineering Proceedings. Bd. 82. H. 1. Basel: MDPI 2024 S. 119
Vidal, Franck P.; Afshari, Shaghayegh; Ahmed, Sharif et al.
X-ray simulations with gVXR as a useful tool for education, data analysis, set-up of CT scans, and scanner developmentBert Müller; Ge Wang (Hrsg). Developments in X-Ray Tomography XV : Optical Engineering + Applications : Proceedings. Bellingham, WA: SPIE 2024
Al-Zaidawi, Sahar Mahdie Klim; Bosse, Stefan
A Pore Classification System for the Detection of Additive Manufacturing Defects Combining Machine Learning and Numerical Image AnalysisStefano Mariani; Francisco Falcone; Stefan Bosse; Jean-Marc Laheurte (Hrsg). The 10th International Electronic Conference on Sensors and Applications : 15–30 November 2023, Online. Basel: MDPI 2023 13 S.
Valle, Maurizio (Hrsg.); Lehmhus, Dirk (Hrsg.); Gianoglio, Christian (Hrsg.) et al.
Advances in System-Integrated Intelligence : Proceedings of the 6th International Conference on System-Integrated Intelligence (SysInt 2022), September 7-9, 2022, Genova, Italy1. Aufl. Cham: Springer 2023 740 S.
Bosse, Stefan
Automated Damage and Defect Detection with Low-Cost X-ray Radiography Using Data-Driven Predictor Models and Data Augmentation by X-ray SimulationStefano Mariani; Francisco Falcone; Stefan Bosse; Jean-Marc Laheurte (Hrsg). The 10th International Electronic Conference on Sensors and Applications : 15–30 November 2023, Online. Basel: MDPI 2023 12 S.