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Magnetic properties of UPd2Al3 thin films investigated by resonant magnetic X-ray scattering

Physica B. Bd. 259/261. 1999 S. 631 - 633

Erscheinungsjahr: 1999

ISBN/ISSN: 0921-4526

Publikationstyp: Zeitschriftenaufsatz

Sprache: Englisch

Doi/URN: 10.1016/S0921-4526(98)01174-0

Volltext über DOI/URN

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Inhaltszusammenfassung


Thin films with thicknesses varying from 100 to 1600 Å of the magnetic heavy-fermion superconductor UPd2Al3 have been investigated by resonant magnetic X-ray scattering. All films studied show the same antiferromagnetic structure as the bulk material. The magnetic order seems to develop initially on the surface of the film and penetrates into the film on lowering the temperature. In the hexagonal c direction (film growth direction) the magnetic correlations extend over the complete film thick...Thin films with thicknesses varying from 100 to 1600 Å of the magnetic heavy-fermion superconductor UPd2Al3 have been investigated by resonant magnetic X-ray scattering. All films studied show the same antiferromagnetic structure as the bulk material. The magnetic order seems to develop initially on the surface of the film and penetrates into the film on lowering the temperature. In the hexagonal c direction (film growth direction) the magnetic correlations extend over the complete film thickness at low temperature. The magnetic correlation lengths in the plane of the film are approximately equal to those along the c-axis. » weiterlesen» einklappen

Autoren


Hiess, A. (Autor)
Bernhoeft, N. (Autor)
Langridge, S. (Autor)
Vettier, C. (Autor)
Jourdan, Martin (Autor)
Huth, M. (Autor)
Lander, G. H. (Autor)

Klassifikation


DFG Fachgebiet:
Physik der kondensierten Materie

DDC Sachgruppe:
Physik

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