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Optical determination of the oxygen content of YBa2Cu3O6+x thin films by IR reflectance and transmittance measurements

Physica C. Bd. 366. H. 1. 2001 S. 63 - 72

Erscheinungsjahr: 2001

ISBN/ISSN: 0921-4534

Publikationstyp: Zeitschriftenaufsatz

Sprache: Englisch

Doi/URN: 10.1016/S0921-4534(01)00788-2

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Inhaltszusammenfassung


Recent studies of the optical properties of YBa2Cu3O6 x (YBCO) single crystals by several authors have shown that the optical conductivity in the infrared spectral region is a sensitive function of the oxygen content of the samples. Infrared spectroscopy thus offers a possibility for oxygen concentration analysis and is an alternative to other methods such as (i) the X-ray determination of the length of the c-axis and (ii) spectroscopic ellipsometry at an electronic transition band centered a...Recent studies of the optical properties of YBa2Cu3O6 x (YBCO) single crystals by several authors have shown that the optical conductivity in the infrared spectral region is a sensitive function of the oxygen content of the samples. Infrared spectroscopy thus offers a possibility for oxygen concentration analysis and is an alternative to other methods such as (i) the X-ray determination of the length of the c-axis and (ii) spectroscopic ellipsometry at an electronic transition band centered around 4.1 eV whose strength decreases with increasing oxygen content. We explore the applicability of the IR optical method for the case of YBCO thin films of about 300 nm thickness which are epitaxially grown on SrTiO3 substrates. We perform normal-incidence transmittance and reflectance measurements between 2000 and 3000 nm to determine the refractive index and the absorption coefficient of the films. Due to the large penetration depth of the IR light it is essential to pay regard to the interferometric aspects of light propagation in the film and to take care of ambiguities in the mathematical inversion. The latter problem is solved by using the asymmetry of the reflectance measured on the two different sides of the sample. It is shown that the accuracy of the results depends on the quality of the films and on the accuracy with which their thickness can be determined by an independent measurement. Despite these difficulties the method provides a simple means for monitoring the oxygen content of YBCO films in the whole doping regime (0x1). » weiterlesen» einklappen

Autoren


Richter, P. (Autor)
Kreß, M. (Autor)
Mohler, E. (Autor)
Roskos, H. G. (Autor)

Klassifikation


DFG Fachgebiet:
Physik der kondensierten Materie

DDC Sachgruppe:
Physik

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