Univ.-Prof. Dr. Hans-Joachim Elmers
Institut für Physik, Johannes Gutenberg-Universität Mainz
- 06131/39-24150
- 06131/39-23807
Kallmayer, M.; Hild, K.; Eichhorn, T. et al.
Solid-state reaction at the interface between Heusler alloys and Al cap accelerated by elevated temperature and rough surfaceApplied physics letters. Bd. 91. H. 19, 192501. 2007
Wegelin, F; Krasyuk, A; Elmers, HJ et al.
Stroboscopic XMCD-PEEM imaging of standing and propagating spinwave modes in permalloy thin-film structuresSURFACE SCIENCE. Bd. 601. H. 20. AMSTERDAM: ELSEVIER SCIENCE BV 2007 S. 4694 - 4699
Jourdan, Martin; Elmers, Hans-Joachim; Adrian, Hermann
Tunneling spectroscopy of the Heusler compound Co2Cr0.6Fe0.1AlJournal of applied physics. Bd. 102. H. 9. Melville, NY: AIP 2007 093710
Schonhense, G; Elmers, HJ
PEEM with high time resolution - imaging of transient processes and novel concepts of chromatic and spherical aberration correctionSURFACE AND INTERFACE ANALYSIS. Bd. 38. H. 12-13. CHICHESTER: JOHN WILEY & SONS LTD 2006 S. 1578 - 1587
Kallmayer, M.; Schneider, Horst; Jakob, Gerhard et al.
Reduction of surface magnetism of Co2Cr0.6Fe0.4Al Heusler alloy filmsApplied physics letters. Bd. 88. H. 7, 072506. 2006
Elmers, Hans-Joachim; Schönhense, Gerhard
The origin of contrast in the imaging of doped areas in silicon by slow electronsJournal of applied physics. Bd. 100. H. 9. Melville, NY: AIP 2006 093712
Schönhense, Gerhard; Elmers, Hans-Joachim
Transient spatio-temporal domain patterns in permalloy microstructures induced by fast magnetic field pulsesNuclear instruments. Bd. 246. H. 1. Amsterdam [u.a.]: Elsevier 2006 S. 1 - 12
Oster, J.; Kallmayer, M.; Wiehl, L. et al.
Crystallography, morphology, and magnetic properties of Fe nanostructures on faceted α-Al2O3 m planeJournal of applied physics. Bd. 97. H. 1. 2005 S. 014303-1 - 014303-10
Fecher, GH; Kandpal, HC; Wurmehl, S et al.
Design of magnetic materials: the electronic structure of the ordered, doped Heusler compound Co2Cr1-xFexAlJOURNAL OF PHYSICS-CONDENSED MATTER. Bd. 17. H. 46. BRISTOL: IOP PUBLISHING LTD 2005 S. 7237 - 7252
Escher, M; Weber, N; Merkel, M et al.
NanoESCA: Imaging UPS and XPS with high energy resolutionJOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. Bd. 144. AMSTERDAM: ELSEVIER SCIENCE BV 2005 S. 1179 - 1182