Augmenting sensitivity analysis for embedded applications by program level derivation of process parameters
Luis Gomes; Eric Dekneuvel; João Paulo Barros (Hrsg). 2007 Symposium on Industrial Embedded Systems Proceedings: Hotel Costa da Caparica, Lisbon, Portugal; 4-6 July 2007. Piscataway, NJ: IEEE Institute of Electrical and Electronics Engineers 2007 S. 17 - 24
Erscheinungsjahr: 2007
ISBN/ISSN: 1-4244-0839-3
Publikationstyp: Diverses (Konferenzbeitrag)
Sprache: Englisch
Doi/URN: 10.1109/SIES.2007.4297312
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