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Magnetic hyperfine fields in ultrathin Ni-films on Cu(100)

Journal of applied physics. Bd. 51. H. 4. Ridge, NY: American Physical Society 1990 S. 317 - 321

Erscheinungsjahr: 1990

ISBN/ISSN: 0031-9007

Publikationstyp: Zeitschriftenaufsatz

Sprache: Englisch

Doi/URN: 10.1007/BF00324311

Volltext über DOI/URN

Geprüft:Bibliothek

Inhaltszusammenfassung


The magnetic hyperfine field was measured at 111In(111Cd) probe atoms in ultrathin Ni films epitaxially grown on Cu(100) utilizing the perturbed γγ-angular correlation (PAC) method. The behaviour of the hyperfine field as a function of temperature was studied for different film thicknesses ranging from 2 up to 10 monolayers. It was found that the strength of the hyperfine fields as well as the critical temperatures are strongly reduced for thin nickel films and approach the bulk value with in...The magnetic hyperfine field was measured at 111In(111Cd) probe atoms in ultrathin Ni films epitaxially grown on Cu(100) utilizing the perturbed γγ-angular correlation (PAC) method. The behaviour of the hyperfine field as a function of temperature was studied for different film thicknesses ranging from 2 up to 10 monolayers. It was found that the strength of the hyperfine fields as well as the critical temperatures are strongly reduced for thin nickel films and approach the bulk value with increasing film thickness. The orientation of the hyperfine field is discussed.» weiterlesen» einklappen

Autoren


Voigt, J. (Autor)
Ding, X.L. (Autor)
Fink, R. (Autor)
Krausch, Georg (Autor)
Luckscheiter, B. (Autor)
Platzer, R. (Autor)
Wöhrmann, U. (Autor)
Schatz, G. (Autor)

Klassifikation


DDC Sachgruppe:
Physik