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Growth and melting behaviour of thin in films on Ge(100)

Journal of applied physics : A. Bd. 53. H. 4. Berlin u.a.: Springer 1991 S. 324 - 329

Erscheinungsjahr: 1991

ISBN/ISSN: 1432-0630 ; 0947-8396

Publikationstyp: Zeitschriftenaufsatz

Sprache: Englisch

Geprüft:Bibliothek

Inhaltszusammenfassung


Growth and melting behaviour of thin indium films on Ge(100) have been investigated by Auger-electron spectroscopy (AES), atomic force microscopy (AFM) and perturbed γγ angular correlation (PAC) spectroscopy, respectively. At room temperature inidium is found to grow in three-dimensional islands even at submonolayer coverages. A very rough film surface is observed for thicknesses up to 230 ML. The melting behaviour of such films has been studied by PAC. A reduction of the melting temperature ...Growth and melting behaviour of thin indium films on Ge(100) have been investigated by Auger-electron spectroscopy (AES), atomic force microscopy (AFM) and perturbed γγ angular correlation (PAC) spectroscopy, respectively. At room temperature inidium is found to grow in three-dimensional islands even at submonolayer coverages. A very rough film surface is observed for thicknesses up to 230 ML. The melting behaviour of such films has been studied by PAC. A reduction of the melting temperature T m as well as a strong supercooling of the films is observed. The electric field gradient for 111In(111Cd) in the indium islands is determined as a function of temperature and is used to monitor the local crystalline order of the films up to temperatures just below the melting point.» weiterlesen» einklappen

Autoren


Krausch, Georg (Autor)
Detzel, T. (Autor)
Bielefeldt, H. (Autor)
Fink, R. (Autor)
Luckscheiter, B. (Autor)
Platzer, R. (Autor)
Wöhrmann, U. (Autor)
Schatz, G. (Autor)

Klassifikation


DDC Sachgruppe:
Physik